Nanoscale polarization relaxation and piezoelectric properties of SBN thin films / Melo M.,Araujo E. B.,Ivanov M.,Shur V. Ya.,Kholkin A. L. // . - 2016. - V. , l. .

ISSN/EISSN:

нет данных / нет данных

Type:

Proceedings Paper

Abstract:

Randomly oriented Sr0.75Ba0.25Nb2O6 thin films have been deposited on Pt(111)/Ti/SiO2/Si substrates using a polymeric chemical route to study their peculiar nanopolar structures and local ferroelectric properties using piezoresponse force microscopy (PFM) technique. PFM images reveals grains with contrast among fully white and fully black, a clear indication of non-zero polarization in the SBN films far above T-m similar to 221 K. Asymmetries observed in local hysteresis loops recorded at different grains suggest an imprint effect in the studied films due to an internal build-in electric field. Some grains show asymmetric hysteresis loops while other grains show symmetric hysteresis loops. The origin of the imprint effect observed in the SBN films is discussed in terms of complex defects associated to oxygen vacancies. The experimental relaxation curves were fitted using the Kohlrausch-Williams-Watts function. The time constant tau increases from 404 to 977 ms as the magnitude voltage increases.

Author keywords:

SBN films; piezoresponse; polarization relaxation STRONTIUM BARIUM NIOBATE; CAPACITORS

DOI:

нет данных

Web of Science ID:

ISI:000391250700024

Соавторы в МНС:

Другие поля

Поле	Значение
Book-Group-Author	IEEE
Booktitle	2016 JOINT IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, EUROPEAN CONFERENCE ON APPLICATION OF POLAR DIELECTRICS, AND PIEZOELECTRIC FORCE MICROSCOPY WORKSHOP (ISAF/ECAPD/PFM)
Note	Joint IEEE International Symposium on the Applications of Ferroelectrics / European Conference on Application of Polar Dielectrics / Piezoelectric Force Microscopy Workshop (ISAF/ECAPD/PFM), Darmstadt, GERMANY, AUG 21-25, 2016
Organization	IEEE
Publisher	IEEE
Address	345 E 47TH ST, NEW YORK, NY 10017 USA
Language	English
ISBN	978-1-5090-1871-0
Keywords-Plus	STRONTIUM BARIUM NIOBATE; CAPACITORS
Research-Areas	Engineering; Physics
Web-of-Science-Categories	Engineering, Electrical \& Electronic; Physics, Applied
Author-Email	eudes@dfq.feis.unesp.br
ResearcherID-Numbers	Kholkin, Andrei/G-5834-2010 Shur, Vladimir/J-9078-2015
ORCID-Numbers	Kholkin, Andrei/0000-0003-3432-7610
Number-of-Cited-References	18
Usage-Count-Last-180-days	1
Usage-Count-Since-2013	2
Doc-Delivery-Number	BG7EN