| References |
Newnham, R.E., Miller, C.S., Cross, L.E., Cline, T.W., (1975) Phys. Status Solidi, 32, p. 69; Fejer, M.M., Magel, G.A., Jundt, D.H., Byer, R.L., (1992) IEEE J. Quantum Electron., 28, p. 2631; Shur, V.Ya., (2008) Handbook of Advanced Dielectric, Piezoelectric and Ferroelectric Materials, pp. 622-669. , edited by Z-G. Ye (Woodhead Publishing); Shur, V.Ya., (2010) Ferroelectrics, 399, p. 97; Shur, V.Ya., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., Batchko, R.G., Fejer, M.M., Byer, R.L., (2001) Ferroelectrics, 257, p. 191; Byer, R.L., (1997) J. Nonlinear Opt. Phys. Mater., 6, p. 549; Volk, T., Wöhlecke, M., (2008) Lithium Niobate, , Springer, Berlin, Heidelberg; Wada, S., (2008) Handbook of Advanced Dielectric, Piezoelectric and Ferroelectric Materials, pp. 266-303. , Elsevier; Wada, S., Suzuki, S., Noma, T., Suzuki, T., Osada, M., Kakihana, M., Park, S.-E., Shrout, T.R., (1999) Jpn. J. Appl. Phys., Part 1, 38, p. 5505; Seidel, J., Martin, L.W., He, Q., Zhan, Q., Chu, Y.-H.Y.-H., Rother, A., Hawkridge, M.E., Ramesh, R., (2009) Nat. Mater., 8, p. 229; Seidel, J., (2012) J. Phys. Chem. Lett., 3, p. 2905; Barth, J.V., Costantini, G., Kern, K., (2005) Nature, 437, p. 671; Shur, V.Ya., (2006) J. Mater. Sci., 41, p. 199; Fridkin, V.M., (1980) Ferroelectric Semiconductors, , Consultants Bureau, New York; Lambeck, P.V., Jonker, G.H., (1986) J. Phys. Chem. Solids, 47, p. 453; Shur, V.Ya., Zelenovskiy, P.S., Nebogatikov, M.S., Alikin, D.O., Sarmanova, M.F., Ievlev, A.V., Mingaliev, E.A., Kuznetsov, D.K., (2011) J. Appl. Phys., 110, p. 52013; Chuvakova, M.A., Vaskina, E.M., Akhmatkhanov, A.R., Baturin, I.S., Shur, V.Ya., (2016) Ferroelectrics, 496, p. 92; Dolbilov, M.A., Shur, V.Ya., Shishkina, E.V., Angudovich, E.S., Ushakov, A.D., Baldi, P., De Micheli, M.P., (2013) Ferroelectrics, 442, p. 82; Roelofs, M.G., Morris, P.A., Bierlein, J.D., (1991) J. Appl. Phys., 70, p. 720; Korkishko, Y.N., Fedorov, V.A., (1999) Ion Exchange in Single Crystals for Integrated Optics and Optoelectronics, , Cambridge International Science Publishing; Vohra, S.T., Mickelson, A.R., Asher, S.E., (1989) J. Appl. Phys., 66, p. 5161; El Hadi, K., Sundheimer, M., Aschieri, P., Baldi, P., De Micheli, M.P., Ostrowsky, D.B., Laurell, F., (1997) J. Opt. Soc. Am. B, 14, p. 3197; Chanvillard, L., Aschiéri, P., Baldi, P., Ostrowsky, D.B., De Micheli, M., Huang, L., Bamford, D.J., (2000) Appl. Phys. Lett., 76, p. 1089; De Micheli, M.P., (2006) Ferroelectrics, 340, p. 49; Jackel, J.L., (1982) Appl. Phys. Lett., 41, p. 607; De Micheli, M., Papuchon, M., Botineau, J., Neveu, S., Sibillot, P., Ostrowsky, D.B., (1983) Opt. Lett., 8, p. 114; Dolbilov, M.A., Shur, V.Ya., Shishkin, E.I., Sarmanova, M.F., Nikolaeva, E.V., Tascu, S., Baldi, P., De Micheli, M.P., (2008) Ferroelectrics, 374, p. 14; Akhmatkhanov, A.R., Chuvakova, M.A., Vaskina, E.M., Shur, V.Ya., (2015) Ferroelectrics, 476, p. 57; Myers, L.E., Eckardt, R.C., Fejer, M.M., Byer, R.L., Bosenberg, W.R., Pierce, J.W., (1995) J. Opt. Soc. Am. B, 12, p. 2102; Shur, V.Ya., Neradovskiy, M.M., Dolbilov, M.A., Lobov, A.I., Zelenovskiy, P.S., Ushakov, A.D., Ushakova, E.S., De Micheli, M.P., (2015) Ferroelectrics, 476, p. 146; Shur, V.Ya., Kosobokov, M.S., Mingaliev, E.A., Karpov, V.R., (2015) AIP Adv., 5, p. 107110; Shur, V.Ya., Alikin, D.O., Ievlev, A.V., Dolbilov, M.A., Sarmanova, M.F., Gavrilov, N.V., (2012) IEEE Trans. Ultrason. Ferroelectr. Freq. Control, 59, p. 1934; Miller, R., Weinreich, G., (1960) Phys. Rev., 117, p. 1460 |