Bulk vs. Surface Structure of 3d Metal Impurities in Topological Insulator Bi2Te3 / Leedahl B.,Boukhvalov D. W.,Kurmaev E. Z.,Kukharenko A.,Zhidkov I. S.,Gavrilov N. V.,Cholakh S. O.,Le P. Huu,Luo C. Wei,Moewes A. // SCIENTIFIC REPORTS. - 2017. - V. 7, l. .

ISSN/EISSN:

2045-2322 / нет данных

Type:

Article

Abstract:

Topological insulators have become one of the most prominent research topics in materials science in recent years. Specifically, Bi2Te3 is one of the most promising for technological applications due to its conductive surface states and insulating bulk properties. Herein, we contrast the bulk and surface structural environments of dopant ions Cr, Mn, Fe, Co, Ni, and Cu in Bi2Te3 thin films in order to further elucidate this compound. Our measurements show the preferred oxidation state and surrounding crystal environment of each 3d-metal atomic species, and how they are incorporated into Bi2Te3. We show that in each case there is a unique interplay between structural environments, and that it is highly dependant on the dopant atom. Mn impurities in Bi2Te3 purely substitute into Bi sites in a 2+ oxidation state. Cr atoms seem only to reside on the surface and are effectively not able to be absorbed into the bulk. Whereas for Co and Ni, an array of substitutional, interstitial, and metallic configurations occur. Considering the relatively heavy Cu atoms, metallic clusters are highly favourable. The situation with Fe is even more complex, displaying a mix of oxidation states that differ greatly between the surface and bulk environments.

Author keywords:

SINGLE DIRAC CONE; BI2SE3; TEMPERATURE; SB2TE3; FILM

DOI:

10.1038/s41598-017-06069-3

Web of Science ID:

ISI:000405746500069

Соавторы в МНС:

Другие поля

Поле	Значение
Month	JUL 18
Publisher	NATURE PUBLISHING GROUP
Address	MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND
Language	English
Article-Number	5758
Keywords-Plus	SINGLE DIRAC CONE; BI2SE3; TEMPERATURE; SB2TE3; FILM
Research-Areas	Science \& Technology - Other Topics
Web-of-Science-Categories	Multidisciplinary Sciences
Author-Email	brett.leedahl@usask.ca
ResearcherID-Numbers	Boukhvalov, Danil/F-7517-2017 Zhidkov, Ivan/L-3543-2013
ORCID-Numbers	Zhidkov, Ivan/0000-0001-8727-4730 Luo, Chih Wei/0000-0002-6453-7435 Cholakh, Seif/0000-0002-9313-6614
Funding-Acknowledgement	Natural Sciences and Engineering Research Council of Canada (NSERC); Canada Research Chair program; Ministry of Education and Science of Russian Federation {[}RFMEFI 58714x0002]; Act 211 Government of the Russian Federation {[}02.A03.21.0006]
Funding-Text	The XAS measurements were performed at the Canadian Light Source, and XES measurements were performed at the Advanced Light Source; both were supported by the Natural Sciences and Engineering Research Council of Canada (NSERC) and the Canada Research Chair program. XPS measurements were supported by the Ministry of Education and Science of Russian Federation (Project RFMEFI 58714x0002). The ion implantation of Bi2Te3 thin films was supported by Act 211 Government of the Russian Federation, agreement No. 02.A03.21.0006.
Number-of-Cited-References	27
Usage-Count-Last-180-days	19
Usage-Count-Since-2013	19
Journal-ISO	Sci Rep
Doc-Delivery-Number	FA9DP