Microstructure of periodic metallic magnetic multilayer systems / Chesnokov Yu. M.,Vasiliev A. L.,Prutskov G. V.,Pashaev E. M.,Subbotin I. A.,Kravtsov E. A.,Ustinov V. V. // THIN SOLID FILMS. - 2017. - V. 632, l. . - P. 79-87.

ISSN/EISSN:

0040-6090 / нет данных

Type:

Article

Abstract:

The results of a complex microstructural analysis of periodic metallic magnetic multilayer systems (MLS) by Scanning/Transmission Electron Microscopy, Energy Dispersive X-ray microanalysis and Resonant X-ray Reflectivity (RXRR) are presented. The crystal structure of MLS based on Cr-Gd-Cr-Fe layers with different Cr layer thicknesses was revealed. The use of RXRR at the Cr and Fe absorption edges significantly improves the optical contrast between correspondent layers. A significant Cr diffusion was detected in adjacent layers. After that diffusion, Fe and Gd layers transformto the solid solution of Cr in Fe and in Gd respectively, without changing their crystal structure. Such Cr behaviormay affect both the exchange coupling between Fe and Gdmagneticmoments and the structural parameters of Gd layers, thus influencing drastically the magnetic moment. (C) 2017 Published by Elsevier B.V.

Author keywords:

Metallic magnetic multilayers; Microstructure; Scanning transmission electron microscopy; Microanalysis; Resonant X-ray reflectivity HETEROSTRUCTURES; PARAMETERS

DOI:

10.1016/j.tsf.2017.04.033

Web of Science ID:

ISI:000402714800012

Соавторы в МНС:

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Другие поля

Поле	Значение
Month	JUN 30
Publisher	ELSEVIER SCIENCE SA
Address	PO BOX 564, 1001 LAUSANNE, SWITZERLAND
Language	English
Keywords-Plus	HETEROSTRUCTURES; PARAMETERS
Research-Areas	Materials Science; Physics
Web-of-Science-Categories	Materials Science, Multidisciplinary; Materials Science, Coatings \& Films; Physics, Applied; Physics, Condensed Matter
Author-Email	AL\_Vasilev@nrcki.ru
ResearcherID-Numbers	Chesnokov, Yury/F-7776-2017 Ustinov, Vladimir/G-7501-2011
ORCID-Numbers	Chesnokov, Yury/0000-0001-8365-4699 Ustinov, Vladimir/0000-0002-5155-7947
Funding-Acknowledgement	RFBR {[}16-32-00224, 14-22-01063]; Ministry of Education and Science of the Russian Federation {[}14-Z-50.31.0025]
Funding-Text	The work was supported partly by the RFBR (grants 16-32-00224 and 14-22-01063) and the Ministry of Education and Science of the Russian Federation (grant 14-Z-50.31.0025). The SEM and X-ray measurements were performed using the equipment of the Resource Center of Probe and Electron Microscopy, the Resource Center of X-ray Methods (The Kurchatov Complex of NBICS-Technologies, the NRC ``Kurchatov Institute{''}) and at the Kurchatov Synchrotron Radiation Source. The authors are most grateful to Mr. M. Borisov for studying the samples at the ``Phase{''} synchrotron station.
Number-of-Cited-References	37
Usage-Count-Last-180-days	2
Usage-Count-Since-2013	2
Journal-ISO	Thin Solid Films
Doc-Delivery-Number	EW7SF