Month |
SEP 15 |
Publisher |
AMER CHEMICAL SOC |
Address |
1155 16TH ST, NW, WASHINGTON, DC 20036 USA |
Language |
English |
Keywords-Plus |
THIN-FILMS; ELECTRONIC-STRUCTURE; OPTICAL-PROPERTIES; HFO2; DEFECTS; OXIDE; IONIZATION; ZIRCONIA |
Research-Areas |
Chemistry; Science \& Technology - Other Topics; Materials Science |
Web-of-Science-Categories |
Chemistry, Physical; Nanoscience \& Nanotechnology; Materials Science, Multidisciplinary |
Author-Email |
timson@isp.nsc.ru |
ResearcherID-Numbers |
Islamov, Damir/A-5708-2014 Yelisseyev, Alexander/A-3846-2014 Perevalov, Timofey/H-4243-2017 |
ORCID-Numbers |
Islamov, Damir/0000-0002-5188-7049 |
Funding-Acknowledgement |
Russian Science Foundation {[}14-19-00192]; Ministry of Science and Technology, Taiwan |
Funding-Text |
This work was supported by the Russian Science Foundation under grant 14-19-00192 (except transport measurements). The works on the transport measurements was supported by the Ministry of Science and Technology, Taiwan. The computations were carried out at the computational cluster of the Novosibirsk State University Supercomputer Center. |
Number-of-Cited-References |
49 |
Usage-Count-Last-180-days |
10 |
Usage-Count-Since-2013 |
19 |
Journal-ISO |
J. Phys. Chem. C |
Doc-Delivery-Number |
DW4VS |