Month |
OCT 3 |
Publisher |
AMER CHEMICAL SOC |
Address |
1155 16TH ST, NW, WASHINGTON, DC 20036 USA |
Language |
English |
Keywords-Plus |
INTERFACIAL LAYER; HIGHLY EFFICIENT; IMPEDANCE SPECTROSCOPY; XPS CHARACTERIZATION; WORK FUNCTION; PERFORMANCE; CATHODE; OXIDE; PHOTOVOLTAICS; STABILITY |
Research-Areas |
Chemistry; Materials Science |
Web-of-Science-Categories |
Chemistry, Multidisciplinary; Chemistry, Physical; Materials Science, Multidisciplinary |
Author-Email |
troshin2003@inbox.ru |
ORCID-Numbers |
Troshin, Pavel/0000-0001-9957-4140 |
Funding-Acknowledgement |
Russian Agency for Scientific Organizations {[}0089-2014-0036]; Russian Foundation for Basic Research (RFBR) {[}16-29-06337 ofi\_m]; Government of Russian Federation (Act 211) {[}02.A03.21.0006]; Russian Federal Agency of Science Organizations {[}01201463326] |
Funding-Text |
We gratefully acknowledge a technical contribution of Mr. R. Levin at early stage of this work. This work was supported by the Russian Agency for Scientific Organizations (project No. 0089-2014-0036) and Russian Foundation for Basic Research (RFBR) (Grant No. 16-29-06337 ofi\_m). XPS measurements were supported by the Government of Russian Federation (Act 211, Agreement No. 02.A03.21.0006), and the Russian Federal Agency of Science Organizations (Project ``Electron{''} No. 01201463326). |
Number-of-Cited-References |
54 |
Usage-Count-Last-180-days |
4 |
Usage-Count-Since-2013 |
4 |
Journal-ISO |
Langmuir |
Doc-Delivery-Number |
FJ4OB |