| References |
Tagantsev, A.K., Stolichnov, I., Colla, E.L., Setter, N., (2001) J. Appl. Phys, 90, p. 1387; Scott, J.F., (2000) Ferroelectric Memories, , Springer, Berlin, Heidelberg; Shur, V.Y., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., Baturin, I.S., (2001) J. Appl. Phys, 90, p. 6312; Shur, V.Y., Baturin, I.S., Shishkin, E.I., Belousova, M.V., (2003) Ferroelectrics, 291, p. 27; Shur, V.Y., Baturin, I.S., Shishkin, E.I., Belousova, M.V., (2003) Integr. Ferroelectr, 53, p. 379; Kimura, S., Izumi, K., Tatsumi, T., (2001) Appl. Phys. Lett, 80, p. 2365; Liu, M., Hsia, K.J., (2003) Appl. Phys. Lett, 83, p. 3978; Thompson, C., Munkholm, A., Streiffer, S.K., Stephenson, G.B., Ghosh, K., Eastman, J.A., Auciello, O., Eom, C.B., (2001) Appl. Phys. Lett, 78, p. 5511; Menou, N., Muller, C., Baturin, I.S., Shur, V.Y., Hodeau, J.-L., (2005) J. Appl. Phys, 97, p. 064108; Menou, N., Muller, C., Baturin, I.S., Kuznetsov, D.K., Shur, V.Y., Hodeau, J.L., Schneller, T., (2005) J. Phys.: Condens. Matter, 17, p. 7681; Baturin, I., Menou, N., Shur, V., Muller, C., Kuznetsov, D., Hodeau, J.-L., Sternberg, A., (2005) Materials Science and Engineering B, 120, p. 141; Shur, V.Y., (2005) Nucleation Theory and Applications, 6, p. 178. , ed. by J.W.P. Schmelzer, Ch, WILEYVCH; Fridkin, V.M., (1980) Ferroelectrics Semiconductors, , Consult. Bureau, New York and London |