References |
Duiker, H.M., Beale, P.D., Scott, J.F., (1990) J. Appl. Phys., 68, p. 5783; Brennan, C.J., (1992) Integr. Ferroelectr., 2, p. 73; Lee, J., Esayan, S., Safari, A., Ramesh, R., (1994) Appl. Phys. Lett., 65, p. 254; Arlt, G., Robels, U., (1993) Integr. Ferroelectr., 3, p. 343; Colla, E., Taylor, D., Tagantsev, A., Setter, N., (1998) Appl. Phys. Lett., 72, p. 2478; Stolichnov, I., Tagantsev, A., Colla, E., Setter, N., (1998) Appl. Phys. Lett., 73, p. 1361; Shur, V., Makarov, S., Ponomarev, N., (1998) J. Korean Phys. Soc., 32, pp. S1714; Colla, E., Hong, S., Taylor, D., (1998) Appl. Phys. Lett., 72, p. 2763; Warren, W., Dimos, D., Tutler, B., (1994) Appl. Phys. Lett., 65, p. 1018; Lemanov, V.V., Yarmarkin, V.K., (1996) Fiz. Tverd. Tela (St. Petersburg), 38, p. 2482. , Phys. Solid State 38, 1363 (1996); Grossmann, M., Boten, D., Lohse, O., (2000) Appl. Phys. Lett., 77, p. 1894; Bratkovsky, A.M., Levanyuk, A.P., (2000) Phys. Rev. Lett., 84, p. 3177; Kholkin, A., Colla, E., Tagantsev, A., (1996) Appl. Phys. Lett., 68, p. 2577; Scott, J.F., Dawber, M., (2000) Appl. Phys. Lett., 76, p. 3801; Ramesh, R., Chan, W.K., Wilkens, B., (1992) Integr. Ferroelectr., 1, p. 1; Kudzin, A.Yu., Panchenko, T.V., Yudin, S.P., (1974) Fiz. Tverd. Tela (Leningrad), 16, p. 2437. , Sov. Phys. Solid State 16, 1589 (1974); Gruverman, A., Auciello, O., Tokumoto, H., (1996) Appl. Phys. Lett., 69, p. 3191; Fridkin, V.M., (1976) Photoferroelectrics, , Nauka, Moscow; Springer, Berlin; Shur, V.Ya., (1996) Ferroelectric Thin Films: Synthesis and Basic Properties, 10. , Gordon and Breach, New York, Chap. 6; Shur, V.Ya., Popov, Yu.A., Korovina, N.V., (1984) Fiz. Tverd. Tela (Leningrad), 26, p. 781. , Sov. Phys. Solid State 26, 471 (1984); Shur, V.Ya., (1998) Phase Transit., 65, p. 49; Shur, V.Ya., Popov, Yu.A., Soldatov, G.B., (1983) Fiz. Tverd. Tela (Leningrad), 25, p. 265. , Sov. Phys. Solid State 25, 148 (1983); Shur, V.Ya., Rumyantsev, E.L., (1997) Ferroelectrics, 191, p. 319; Yurin, V.A., (1960) Izv. Akad. Nauk SSSR, Ser. Fiz., 24, p. 1329; Robels, U., Arlt, G., (1993) J. Appl. Phys., 73, p. 3454; Lambeck, P., Jonker, G., (1986) J. Phys. Chem. Solids, 47, p. 453; Stolichnov, I., Tagantsev, A., Setter, N., (1999) Appl. Phys. Lett., 74, p. 3552; Shur, V.Ya., (1990), Author's Abstract of Doctoral Dissertation (UPI, Sverdlovsk); Shur, V.Ya., Rumyantsev, E.L., Nikolaeva, E.V., (2001) Integr. Ferroelectr., 33, p. 117; Shur, V.Ya., Rumyantsev, E.L., Nikolaeva, E.V., (2001) J. Appl. Phys., 90, p. 6312; Miller, R.C., Weinreich, G., (1960) Phys. Rev., 117, p. 1460; Hayashi, M., (1972) J. Phys. Soc. Jpn., 33, p. 616; Robert, G., Damjanovic, D., Setter, N., (2000) Appl. Phys. Lett., 77, p. 4413; Bartic, A., Wouters, D., Maes, H., (2001) J. Appl. Phys., 89, p. 3420; Shur, V.Ya., Rumyantsev, E.L., Nikolaeva, E.V., J. Appl. Phys., , in press |