References |
Maignan, A., Martin, C., Pelloquin, D., Nguyen, N., Raveau, B., (1999) J. Solid State Chem., 142, p. 247; Burley, J.C., Mitchell, J.F., Short, S., Miller, D., Tang, Y., (2003) J. Solid State Chem., 170, p. 339; Taskin, A.A., Lavrov, A.N., Ando, Y., (2005) Appl. Phys. Lett., 86, p. 091910; Malavasi, L., Diaz-Fernandez, Y., Mozzati, M.C., Ritter, C., (2008) Solid State Commun., 14 (8), p. 87; Kim, J.-H., Manthiram, A., (2008) J. Electrochem. Soc., 155, p. 385; Zhang, K., Ge, L., Ran, R., Shao, Z., Liu, S., (2008) Acta Mater., 56, p. 4876; Kim, J.-H., Prado, F., Manthirama, A., (2008) J. Electrochem. Soc., 155, p. 1023; Tarancón, A., Peña-Martínez, J., Marrero-López, D., Morata, A., Ruiz-Morales, J.C., Núñez, P., (2008) Solid State Ionics, 179, p. 2372; Tai, L.-W., Nasrallah, M.M., Anderson, H.U., Sparlin, D.M., Sehlin, S.R., (1995) Solid State Ionics, 76, p. 259; Tsvetkov, D.S., Sereda, V.V., Zuev, A.Yu., (2010) Solid State Ionics, 180, p. 1620; Tarancón, A., Marrero-López, D., Peña-Martínez, J., Ruiz-Morales, J.C., Núñez, P., (2008) Solid State Ionics, 179, p. 611; Bucher, E., Sitte, W., Caraman, G.B., (2006) Solid State Ionics, 177, p. 3109; Bishop, S.R., Duncan, K.L., Wachsman, E.D., (2009) J. Electrochem. Soc., 156, pp. 1242-B1248; Poulsen, F.W., (2007) Methods and Limitations of Defect Chemistry Modeling, , Thesis for the degree of Doctor Technices, Riso National Laboratory, DTU, Roskilde, Denmark |