| References |
Chu, Y.H., Martin, L.W., Holcomb, M.B., Gajek, M., Han, S.J., He, Q., Balke, N., Ramesh, R., (2008) Nat. Mater., 7, p. 478; Fusil, S., Garcia, V., Barthelemy, A., Bibes, M., (2014) Annu. Rev. Mater. Res., 44, p. 91; Kimura, T., Goto, T., Shintani, H., Ishizaka, K., Arima, T., Tokura, Y., (2003) Nature, 426, p. 55; Vaz, C.A., Hoffman, J., Ahn, C.H., Ramesh, R., (2010) Adv. Mater., 22, p. 2900; Fiebig, M., (2005) J. Phys. D: Appl. Phys., 38, p. R123; Nan, C.-W., Bichurin, M.I., Dong, S., Viehland, D., Srinivasan, G., (2008) J. Appl. Phys., 103, p. 31101; Ma, J., Hu, J., Li, Z., Nan, C.-W., (2011) Adv. Mater., 23, p. 1062; Labusch, M., Etier, M., Lupascu, D.C., Schröder, J., Keip, M.-A., (2014) Comput. Mech., 54, p. 71; Nye, J.F., (1985) Physical Properties of Crystals. Their Representation by Tensors and Matrices, , Clarendon Press, Oxford University Press, Oxford [Oxfordshire], New York, 1st edn; Etier, M., Shvartsman, V.V., Gao, Y., Landers, J., Wende, H., Lupascu, D.C., (2013) Ferroelectrics, 448, p. 77; Corral-Flores, V., Bueno-Baques, D., Carrillo-Flores, D., Matutes-Aquino, J.A., (2006) J. Appl. Phys., 99, p. 08J503; Duong, G.V., Groessinger, R., Sato Turtelli, R., (2007) J. Magn. Magn. Mater., 310, pp. 1157-1159; Schmitz-Antoniak, C., Schmitz, D., Borisov, P., De Groot, F.M., Stienen, S., Warland, A., Krumme, B., Wende, H., (2013) Nat. Commun., 4, p. 2051; Duong, G.V., Groessinger, R., (2007) J. Magn. Magn. Mater., 316, p. e624; Kholkin, A.L., Kalinin, S.V., Roelofs, A., Gruverman, A., (2007) Scanning Probe Microscopy, pp. 173-214. , ed. S. V. Kalinin and A. Gruverman, Springer, New York; Vasudevan, R.K., Jesse, S., Kim, Y., Kumar, A., Kalinin, S.V., (2012) MRS Commun., 2, p. 61; Hartmann, U., (1999) Annu. Rev. Mater. Sci., 29, p. 53; Proksch, R.B., Schäffer, T.E., Moskowitz, B.M., Dahlberg, E.D., Bazylinski, D.A., Frankel, R.B., (1995) Appl. Phys. Lett., 66, p. 2582; Shvartsman, V.V., Kholkin, A.L., (2011) Multifunctional Polycrystalline Ferroelectric Materials. Processing and Properties, 140, pp. 409-468. , ed. L. Pardo and J. Ricote, Springer, Dordrecht, New York; Zavaliche, F., Zheng, H., Mohaddes-Ardabili, L., Yang, S.Y., Zhan, Q., Shafer, P., Reilly, E., Ramesh, R., (2005) Nano Lett., 5, p. 1793; Geng, Y., Das, H., Wysocki, A.L., Wang, X., Cheong, S.W., Mostovoy, M., Fennie, C.J., Wu, W., (2014) Nat. Mater., 13, p. 163; Yan, F., Chen, G., Lu, L., Finkel, P., Spanier, J.E., (2013) Appl. Phys. Lett., 103, p. 42906; Pan, M., Hong, S., Guest, J.R., Liu, Y., Petford-Long, A., (2013) J. Phys. D: Appl. Phys., 46, p. 55001; Caruntu, G., Yourdkhani, A., Vopsaroiu, M., Srinivasan, G., (2012) Nanoscale, 4, p. 3218; Karpinsky, D.V., Pullar, R.C., Fetisov, Y.K., Kamentsev, K.E., Kholkin, A.L., (2010) J. Appl. Phys., 108, p. 42012; Weber, W.H., Merlin, R., (2000) Raman Scattering in Materials Science, , ed., Springer, Berlin, Heidelberg; Dieing, T., Hollricher, O., Toporski, J., (2010) Confocal Raman Microcopy, 158. , Springer, Heidelberg; Shur, V.Y., Zelenovskiy, P.S., (2014) J. Appl. Phys., 116, p. 66802; Zelenovskiy, P.S., Shur, V.Y., Bourson, P., Fontana, M.D., Kuznetsov, D.K., Mingaliev, E.A., (2010) Ferroelectrics, 398, p. 34; Shur, V.Y., Zelenovskiy, P.S., Nebogatikov, M.S., Alikin, D.O., Sarmanova, M.F., Ievlev, A.V., Mingaliev, E.A., Kuznetsov, D.K., (2011) J. Appl. Phys., 110, p. 52013; Jesse, S., Baddorf, A.P., Kalinin, S.V., (2006) Appl. Phys. Lett., 88, p. 62908; Jesse, S., Lee, H.N., Kalinin, S.V., (2006) Rev. Sci. Instrum., 77, p. 73702; Kholkin, A.L., Brooks, K.G., Taylor, D.V., Hiboux, S., Setter, N., (1998) Integr. Ferroelectr., 22, p. 525; Fridkin, V.N., (1980) Ferroelectric Semiconductors, , Consultants Bureau, New York, 1st edn; Meftah, A., Costantini, J.M., Khalfaoui, N., Boudjadar, S., Stoquert, J.P., Studer, F., Toulemonde, M., (2005) Nucl. Instrum. Methods Phys. Res., Sect. B, 237, p. 563; Fang, C.M., Kools, F., Metselaar, R., De With, G., De Groot, R.A., (2003) J. Phys.: Condens. Matter, 15, p. 6228; Wemple, S.H., (1970) Phys. Rev. B: Condens. Matter, 2, p. 2679; Eshelby, J.D., (1957) Proc. R. Soc. London, A, 241, p. 376; Schulze, G., (1963) Z. Angew. Math. Mech., 43, p. 512; Abplanalp, M., (2001) Piezoresponse Scanning Force Microscopy of Ferroelectric Domains, , Ph.D., Zürich; Rahe, P., Bechstein, R., Kühnle, A., (2010) J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct., 28, p. C4E31; Duong, G.V., Groessinger, R., Schoenhart, M., Bueno-Basques, D., (2007) J. Magn. Magn. Mater., 316, p. 390; Miao, H., Zhou, X., Dong, S., Luo, H., Li, G.F., (2014) Nanoscale, 6, p. 8515; Shinzawa, H., Awa, K., Kanematsu, W., Ozaki, Y., (2009) J. Raman Spectrosc., 40, p. 1720; Awa, K., Okumura, T., Shinzawa, H., Otsuka, M., Ozaki, Y., (2008) Anal. Chim. Acta, 619, p. 81; Lee, D.D., Seung, H.S., (2001) Adv. Neural Inf. Proc. Syst., 13, p. 556; Venkateswaran, U.D., Naik, V.M., Naik, R., (1998) Phys. Rev. B: Condens. Matter, 58, p. 14256; Sood, A.K., Chandrabhas, N., Muthu, D.V.S., Jayaram, A., (1995) Phys. Rev. B: Condens. Matter, 51, p. 8892; Li, Z., Wang, Y., Lin, Y., Nan, C., (2009) Phys. Rev. B: Condens. Matter, 79, p. 180406R; Zhang, W., Chen, L., Jin, C., Deng, X., Wang, X., Li, L., (2008) J. Electroceram., 21, p. 859; Chesnokov, A.G., Na, E.P., (2001) Phys. Solid State, 43, p. 1728. , 1730; Bozorth, R.M., (1955) Phys. Rev., 99, p. 1788 |