Micro- and nanodomain imaging in uniaxial ferroelectrics: Joint application of optical, confocal Raman, and piezoelectric force microscopy / Shur V.Ya., Zelenovskiy P.S. // Journal of Applied Physics. - 2014. - V. 116, l. 6.

ISSN:
00218979
Type:
Article
Abstract:
The application of the most effective methods of the domain visualization in model uniaxial ferroelectrics of lithium niobate (LN) and lithium tantalate (LT) family, and relaxor strontium-barium niobate (SBN) have been reviewed in this paper. We have demonstrated the synergetic effect of joint usage of optical, confocal Raman, and piezoelectric force microscopies which provide extracting of the unique information about formation of the micro- and nanodomain structures. The methods have been applied for investigation of various types of domain structures with increasing complexity: (1) periodical domain structure in LN and LT, (2) nanodomain structures in LN, LT, and SBN, (3) nanodomain structures in LN with modified surface layer, (4) dendrite domain structure in LN. The self-assembled appearance of quasi-regular nanodomain structures in highly non-equilibrium switching conditions has been considered. © 2014 AIP Publishing LLC.
Author keywords:
Index keywords:
Physical properties; Domain visualization; Lithium tantalate; Modified surfaces; Nanodomain structures; Periodical domain structures; Piezoelectric force microscopy; Switching conditions; Synergetic e
DOI:
10.1063/1.4891397
Смотреть в Scopus:
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906308975&doi=10.1063%2f1.4891397&partnerID=40&md5=81256782814104aafed273e24c2b67f2
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Art. No. 066802
Link https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906308975&doi=10.1063%2f1.4891397&partnerID=40&md5=81256782814104aafed273e24c2b67f2
Affiliations Ferroelectric Laboratory, Institute of Natural Sciences, Ural Federal University, 620000 Ekaterinburg, Russian Federation
Funding Details 12-02-31377-mol-a, RFBR, Russian Foundation for Basic Research; 13-02-01391-a, RFBR, Russian Foundation for Basic Research; 13-02-96041-r-Ural-a, RFBR, Russian Foundation for Basic Research
References Newnham, R.E., Miller, C.S., Cross, L.E., Cline, T.W., (1975) Phys. Status Solidi, 32, p. 69. , 10.1002/pssa.2210320107; Shur, V.Y., (2008) Handbook of Advanced Dielectric, Piezoelectric and Ferroelectric Materials: Synthesis, Properties and Applications, pp. 622-669. , in, edited by Z.-G. Ye (Woodhead Publishing Ltd); Batchko, R.G., Shur, V.Y., Fejer, M.M., Byer, R.L., (1999) Appl. Phys. Lett., 75, p. 1673. , 10.1063/1.124787; Shur, V.Y., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., Batchko, R.G., Miller, G.D., Fejer, M.M., Byer, R.L., (2000) Ferroelectrics, 236, p. 129. , 10.1080/00150190008016047; Shur, V.Y., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., Batchko, R.G., Fejer, M.M., Byer, R.L., (2001) Ferroelectrics, 257, p. 191. , 10.1080/00150190108016300; Byer, R.L., (1997) J. Nonlinear Opt. Phys. Mater., 6, p. 549. , 10.1142/S021886359700040X; Shur, V.Y., (2008) Ferroelectrics, 373, p. 1. , 10.1080/00150190802408457; Shur, V.Y., (2010) Ferroelectrics, 399, p. 97. , 10.1080/00150193.2010.490290; Shur, V.Y., (2013) Ferroelectrics, 443, p. 71. , 10.1080/10584587.2013.794638; Shur, V.Y., (1996) Ferroelectric Thin Film: Synthesis and Basic Properties (Ferroelectricity and Related Phenomena Series, pp. 153-192. , in, edited by C. A. Paz de Araujo, J. F. Scott, and G. W. Taylor (Gordon & Breach Science Publications); Shur, V.Y., (2005) Nucleation Theory Application, pp. 178-214. , in, edited by J. W. P. Schmelzer (Wiley-VCH, Weinheim); Shur, V.Y., (2006) J. Mater. Sci., 41, p. 199. , 10.1007/s10853-005-6065-7; Shur, V.Y., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., Fursov, D.V., Batchko, R.G., Eyres, L.A., Byer, R.L., (2000) Appl. Phys. Lett., 76, p. 143. , 10.1063/1.125683; Shur, V.Y., (1998) Phase Transitions, 65, p. 49. , 10.1080/01411599808209280; Chernykh, A., Shur, V., Nikolaeva, E., Shishkin, E., Shur, A., Terabe, K., Kurimura, S., Gallo, K., (2005) Mater. Sci. Eng., B, 120, p. 109. , 10.1016/j.mseb.2005.02.007; Miller, R., Weinreich, G., (1960) Phys. Rev., 117, p. 1460. , 10.1103/PhysRev.117.1460; Shur, V.Y., Shishkin, E.I., Rumyantsev, E.L., Nikolaeva, E.V., Shur, A.G., Batchko, R.G., Fejer, M.M., Kitamura, K., (2004) Ferroelectrics, 304, p. 111. , 10.1080/00150190490457636; Shur, V.Y., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., Fursov, D.V., Batchko, R.G., Eyres, L.A., Sindel, J., (2001) Ferroelectrics, 253, p. 105. , 10.1080/00150190108008448; Shur, V.Y., Rumyantsev, E.L., Shur, A.G., Lobov, A.I., Kuznetsov, D.K., Shishkin, E.I., Nikolaeva, E.V., Micheli, M.P.D., (2007) Ferroelectrics, 354, p. 145. , 10.1080/00150190701454818; Armstrong, J., Bloembergen, N., Ducuing, J., Pershan, P., (1962) Phys. Rev., 127, p. 1918. , 10.1103/PhysRev.127.1918; Hum, D.S., Fejer, M.M., (2007) C. R. Phys., 8, p. 180. , 10.1016/j.crhy.2006.10.022; Batchko, R.G., Fejer, M.M., Byer, R.L., Woll, D., Wallenstein, R., Shur, V.Y., Erman, L., (1999) Opt. Lett., 24, p. 1293. , 10.1364/OL.24.001293; Harris, S.E., (1966) Appl. Phys. Lett., 9, p. 114. , 10.1063/1.1754668; Seidel, J., Martin, L.W., He, Q., Zhan, Q., Chu, Y.-H., Rother, A., Hawkridge, M.E., Ramesh, R., (2009) Nature Mater., 8, p. 229. , 10.1038/nmat2373; Catalan, G., Seidel, J., Ramesh, R., Scott, J., (2012) Rev. Mod. Phys., 84, p. 119. , 10.1103/RevModPhys.84.119; Shur, V.Y., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., (2000) Appl. Phys. Lett., 77, p. 3636. , 10.1063/1.1329327; Eliseev, E., Morozovska, A., Svechnikov, G., Gopalan, V., Shur, V., (2011) Phys. Rev. B, 83, p. 235313. , 10.1103/PhysRevB.83.235313; Gureev, M., Tagantsev, A., Setter, N., (2011) Phys. Rev. B, 83, p. 184104. , 10.1103/PhysRevB.83.184104; Mokrý, P., Tagantsev, A., Fousek, J., (2007) Phys. Rev. B, 75, p. 094110. , 10.1103/PhysRevB.75.094110; Shur, V.Y., Baturin, I.S., Akhmatkhanov, A.R., Chezganov, D.S., Esin, A.A., (2013) Appl. Phys. Lett., 103, p. 102905. , 10.1063/1.4820351; Miller, R.C., (1964) Phys. Rev., 134, pp. A1313. , 10.1103/PhysRev.134.A1313; Sugita, T., Mizuuchi, K., Kitaoka, Y., Yamamoto, K., (2001) Jpn. J. Appl. Phys. Part 1, 40, p. 1751. , 10.1143/JJAP.40.1751; Kintaka, K., Fujimura, M., Suhara, T., Nishihara, H., (1996) Electron. Lett., 32, p. 2237. , 10.1049/el:19961467; Mizuuchi, K., Yamamoto, K., (1995) Appl. Phys. Lett., 66, p. 2943. , 10.1063/1.114237; Meyn, J.-P., Fejer, M.M., (1997) Opt. Lett., 22, p. 1214. , 10.1364/OL.22.001214; Ishizuki, H., Taira, T., (2005) Opt. Lett., 30, p. 2918. , 10.1364/OL.30.002918; Shur, V.Y., Rumyantsev, E.L., (1993) Ferroelectrics, 142, p. 1. , 10.1080/00150199308237878; Shur, V.Y., Rumyantsev, E.L., (1994) Ferroelectrics, 151, p. 171. , 10.1080/00150199408244739; Cahn, J.W., (1960) Acta Metall., 8, p. 554. , 10.1016/0001-6160(60)90110-3; Lobov, A.I., Shur, V.Y., Baturin, I.S., Shishkin, E.I., Kuznetsov, D.K., Shur, A.G., Dolbilov, M.A., Gallo, K., (2006) Ferroelectrics, 341, p. 109. , 10.1080/00150190600896994; Shur, V.Y., Lobov, A.I., Shur, A.G., Rumyantsev, E.L., Gallo, K., (2007) Ferroelectrics, 360, p. 111. , 10.1080/00150190701517580; Dolbilov, M.A., Shishkin, E.I., Shur, V.Y., Tascu, S., Baldi, P., Micheli, M.P.D., (2010) Ferroelectrics, 398, p. 108. , 10.1080/00150193.2010.489840; Dolbilov, M.A., Shur, V.Y., Shishkina, E.V., Angudovich, E.S., Ushakov, A.D., Baldi, P., Micheli, M.P.D., (2013) Ferroelectrics, 442, p. 82. , 10.1080/10584587.2013.776408; Shishkin, E.I., Nikolaeva, E.V., Shur, V.Y., Sarmanova, M.F., Dolbilov, M.A., Nebogatikov, M.S., Alikin, D.O., Gavrilov, N.V., (2010) Ferroelectrics, 399, p. 49. , 10.1080/00150193.2010.489860; Alikin, D.O., Shishkin, E.I., Nikolaeva, E.V., Shur, V.Y., Sarmanova, M.F., Ievlev, A.V., Nebogatikov, M.S., Gavrilov, N.V., (2010) Ferroelectrics, 399, p. 35. , 10.1080/00150193.2010.489855; Alikin, D.O., Shur, V.Y., Pryakhina, V.I., Gavrilov, N.V., Carrascosa, M., Olivares, J., (2012) Ferroelectrics, 441, p. 17. , 10.1080/00150193.2012.746611; Akhmatkhanov, A.R., Shur, V.Y., Baturin, I.S., Zorikhin, D.V., Lukmanova, A.M., Zelenovskiy, P.S., Neradovskiy, M.M., (2012) Ferroelectrics, 439, p. 3. , 10.1080/00150193.2012.743369; Shur, V.Y., Letuchev, V.V., Rumyantsev, E.L., (1984) Sov. Phys. Solid State, 26, p. 1521; Shur, V.Y., Letuchev, V.V., Rumyantsev, E.L., Ovechkina, I.V., (1985) Sov. Phys. Solid State, 27, p. 959; Shur, V.Y., Nikolaeva, E.V., Shishkin, E.I., Chernykh, A.P., Terabe, K., Kitamura, K., Ito, H., Nakamura, K., (2002) Ferroelectrics, 269, p. 195. , 10.1080/00150190211168; Shur, V.Y., Akhmatkhanov, A.R., Chezganov, D.S., Lobov, A.I., Baturin, I.S., Smirnov, M.M., (2013) Appl. Phys. Lett., 103, p. 242903. , 10.1063/1.4846015; Fridkin, V.M., (1980) Ferroelectric Semiconductors, p. 318. , (Consultants Bureau, New York); Shur, V., Rumyantsev, E., Batchko, R., Miller, G., Fejer, M., Byer, R., (1999) Ferroelectrics, 221, p. 157. , 10.1080/00150199908016450; Eliseev, E., Morozovska, A., Svechnikov, G., Rumyantsev, E., Shishkin, E., Shur, V., Kalinin, S., (2008) Phys. Rev. B, 78, p. 245409. , 10.1103/PhysRevB.78.245409; Cross, L.E., (1994) Ferroelectrics, 151, p. 305. , 10.1080/00150199408244755; Blinc, R., Laguta, V.V., Zalar, B., Banys, J., (2006) J. Mater. Sci., 41, p. 27. , 10.1007/s10853-005-5914-8; Bokov, A.A., Ye, Z.-G., (2006) J. Mater. Sci., 41, p. 31. , 10.1007/s10853-005-5915-7; Prokhorov, A.M., Kuz'Minov, Y.S., (1990) Ferroelectric Crystals for Laser Radiation Control, , (Adam Hilger, Bristol); Smolensky, G.A., Isupov, V.A., (1954) Sov. J. Tech. Phys., 24, p. 1375; Samara, G.A., (2003) J. Phys. Condens. Matter, 15, pp. R367. , 10.1088/0953-8984/15/9/202; Egami, T., Teslic, S., Dmowski, W., Viehland, D., Vakhrushev, S., (1997) Ferroelectrics, 199, p. 103. , 10.1080/00150199708213432; Terabe, K., Takekawa, S., Nakamura, M., Kitamura, K., Higuchi, S., Gotoh, Y., Gruverman, A., (2002) Appl. Phys. Lett., 81, p. 2044. , 10.1063/1.1506945; Dec, J., Shvartsman, V.V., Kleemann, W., (2006) Appl. Phys. Lett., 89, p. 212901. , 10.1063/1.2392989; Tian, L., Scrymgeour, D.A., Gopalan, V., (2005) J. Appl. Phys., 97, p. 114111. , 10.1063/1.1925330; Shur, V.Y., Pelegov, D.V., Shikhova, V.A., Kuznetsov, D.K., Nikolaeva, E.V., Rumyantsev, E.L., Yakutova, O.V., Granzow, T., (2008) Ferroelectrics, 374, p. 33. , 10.1080/00150190802424785; Shur, V.Y., Shikhova, V.A., Pelegov, D.V., Ievlev, A.V., Ivleva, L.I., (2011) Phys. Solid State, 53, p. 2311. , 10.1134/S106378341111028X; Volk, T., Wöhlecke, M., (2008) Lithium Niobate: Defects, Photorefraction and Ferroelectric Switching, p. 264. , (Springer-Verlag, Berlin, Heidelberg); Furukawa, Y., Kitamura, K., Takekawa, S., Niwa, K., Hatano, H., (1998) Opt. Lett., 23, p. 1892. , 10.1364/OL.23.001892; Kitamura, K., Furukawa, Y., Niwa, K., Gopalan, V., Mitchell, T.E., (1998) Appl. Phys. Lett., 73, p. 3073. , 10.1063/1.122676; Niwa, K., Furukawa, Y., Takekawa, S., Kitamura, K., (2000) J. Cryst. Growth, 208, p. 493. , 10.1016/S0022-0248(99)00450-9; Huang, L., Hui, D., Bamford, D.J., Field, S.J., Mnushkina, I., Myers, L.E., Kayser, J.V., (2001) Appl. Phys. B, 72, p. 301. , 10.1007/s003400100493; Glass, A.M., (1969) J. Appl. Phys., 40, p. 4699. , 10.1063/1.1657277; Shur, V., Shikhova, V., Ievlev, A., Zelenovskiy, P., Neradovskiy, M., Pelegov, D., Ivleva, L., (2012) J. Appl. Phys., 112, p. 064117. , 10.1063/1.4754511; Volk, T.R., Salobutin, V.Y., Ivleva, L.I., Polozkov, N.M., Pankrath, R., Woehlecke, M., (2000) Phys. Solid State, 42, p. 2129. , 10.1134/1.1324052; Soergel, E., (2005) Appl. Phys. B, 81, p. 729. , 10.1007/s00340-005-1989-9; Shur, V.Y., Lobov, A.I., Shur, A.G., Kurimura, S., Nomura, Y., Terabe, K., Liu, X.Y., Kitamura, K., (2005) Appl. Phys. Lett., 87, p. 022905. , 10.1063/1.1993769; Sones, C.L., Mailis, S., Brocklesby, W.S., Eason, R.W., Owen, J.R., (2002) J. Mater. Chem., 12, p. 295. , 10.1039/b106279b; Alexe, M., Gruverman, A., (2004) Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach, p. 282. , (Springer-Verlag, Berlin, Heidelberg, New York); Kalinin, S.V., Gruverman, A., (2007) Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, p. 980. , (Springer Science +Business Media, LLC); Shur, V.Y., Gruverman, A.L., Kuminov, V.P., Tonkachyova, N.A., (1990) Ferroelectrics, 111, p. 197. , 10.1080/00150199008224399; Shur, V.Y., Gruverman, A., Ponomarev, N., Rumyantsev, E.L., Tonkachyova, N.A., (1991) JETP Lett., 53, p. 615; Shur, V.Y., Gruverman, A., Ponomarev, N., Rumyantsev, E.L., Tonkachyova, N.A., (1992) Integr. Ferroelectr., 2, p. 51. , 10.1080/10584589208215731; Huey, B.D., Premnath, R.N., Lee, S., Polomoff, N.A., (2012) J. Am. Ceram. Soc., 95, p. 1147. , 10.1111/j.1551-2916.2012.05099.x; Bogner, A., Jouneau, P.-H., Thollet, G., Basset, D., Gauthier, C., (2007) Micron, 38, p. 390. , 10.1016/j.micron.2006.06.008; Shur, V.Y., Shishkin, E.I., Nikolaeva, E.V., Nebogatikov, M.S., Alikin, D.O., Zelenovskiy, P.S., Sarmanova, M.F., Dolbilov, M.A., (2010) Ferroelectrics, 398, p. 91. , 10.1080/00150193.2010.489838; Gruverman, A., Kalinin, S.V., (2006) J. Mater. Sci., 41, p. 107. , 10.1007/s10853-005-5946-0; Kalinin, S.V., Morozovska, A.N., Chen, L.Q., Rodriguez, B.J., (2010) Rep. Prog. Phys., 73, p. 056502. , 10.1088/0034-4885/73/5/056502; Kalinin, S., Rar, A., Jesse, S., (2006) IEEE Trans. Ultrason. Ferroelectr. Freq. Control, 53, p. 2226. , 10.1109/TUFFC.2006.169; Kalinin, S., Bonnell, D., (2002) Phys. Rev. B, 65, p. 125408. , 10.1103/PhysRevB.65.125408; Balke, N., Bdikin, I., Kalinin, S.V., Kholkin, A.L., (2009) J. Am. Ceram. Soc., 92, p. 1629. , 10.1111/j.1551-2916.2009.03240.x; Bonnell, D.A., Kalinin, S.V., Kholkin, A.L., Gruverman, A., (2009) MRS Bull., 34, p. 648. , 10.1557/mrs2009.176; Zelenovskiy, P.S., Shur, V.Y., Bourson, P., Fontana, M.D., Kuznetsov, D.K., Mingaliev, E.A., (2010) Ferroelectrics, 398, p. 34. , 10.1080/00150193.2010.489810; Shur, V.Y., Zelenovskiy, P.S., Nebogatikov, M.S., Alikin, D.O., Sarmanova, M.F., Ievlev, A.V., Mingaliev, E.A., Kuznetsov, D.K., (2011) J. Appl. Phys., 110, p. 052013. , 10.1063/1.3623778; Hammoum, R., Fontana, M.D., Bourson, P., Shur, V.Y., (2007) Ferroelectrics, 352, p. 106. , 10.1080/00150190701358191; Hammoum, R., Fontana, M.D., Bourson, P., Shur, V.Y., (2008) Appl. Phys. A, 91, p. 65. , 10.1007/s00339-007-4356-3; Capek, P., Stone, G., Dierolf, V., Althouse, C., Gopalan, V., (2007) Phys. Status Solidi, 4, p. 830. , 10.1002/pssc.200673720; Zelenovskiy, P.S., Shikhova, V.A., Ievlev, A.V., Neradovskiy, M.M., Shur, V.Y., (2012) Ferroelectrics, 439, p. 33. , 10.1080/00150193.2012.746890; Zelenovskiy, P.S., Fontana, M.D., Shur, V.Y., Bourson, P., Kuznetsov, D.K., (2010) Appl. Phys. A, 99, p. 741. , 10.1007/s00339-010-5621-4; Hollricher, O., Ibah, W., (2011) Confocal Raman Microscope, pp. 1-20. , in, edited by T. Dieing, O. Hollricher, and J. Toporski (Springer, Berlin, Heidelberg); Uesu, Y., Yokota, H., Kawado, S., Kaneshiro, J., Kurimura, S., Kato, N., (2007) Appl. Phys. Lett., 91, p. 182904. , 10.1063/1.2786589; Kaneshiro, J., Kawado, S., Yokota, H., Uesu, Y., Fukui, T., (2008) J. Appl. Phys., 104, p. 054112. , 10.1063/1.2975218; Yokota, H., Oyama, T., Uesu, Y., (2005) Phys. Rev. B, 72, p. 144103. , 10.1103/PhysRevB.72.144103; Uesu, Y., Kurimura, S., Yamamoto, Y., (1995) Appl. Phys. Lett., 66, p. 2165. , 10.1063/1.113934; Denev, S.A., Lummen, T.T.A., Barnes, E., Kumar, A., Gopalan, V., (2011) J. Am. Ceram. Soc., 94, p. 2699. , 10.1111/j.1551-2916.2011.04740.x; Grilli, S., Ferraro, P., Paturzo, M., Alfieri, D., Natale, P.D., Angelis, M.D., Nicola, S.D., Pierattini, G., (2004) Opt. Express, 12, p. 1832. , 10.1364/OPEX.12.001832; Canalias, C., Pasiskevicius, V., Laurell, F., Grilli, S., Ferraro, P., Natale, P.D., (2007) J. Appl. Phys., 102, p. 064105. , 10.1063/1.2781567; Tikhomirov, O., Red'Kin, B., (1999) Ferroelectrics, 222, p. 339. , 10.1080/00150199908014835; Tikhomirov, O., Levy, J., (2000) J. Opt. Soc. Am. A, 17, p. 1214. , 10.1364/JOSAA.17.001214; Tikhomirov, O., Red'Kin, B., Trivelli, A., Levy, J., (2000) J. Appl. Phys., 87, p. 1932. , 10.1063/1.372115; Tikhomirov, O., Levy, J., (2003) Ferroelectrics, 292, p. 161. , 10.1080/00150190390222952; Kong, Y., Xu, J., Li, B., Chen, S., Huang, Z., Zhang, L., Liu, S., Zhang, G., (2004) Opt. Mater. (Amsterdam), 27, p. 471. , 10.1016/j.optmat.2004.03.029; Fontana, M.D., Hammoum, R., Bourson, P., Margueron, S., Shur, V.Y., (2008) Ferroelectrics, 373, p. 26. , 10.1080/00150190802408598; Zelenovskiy, P.S., Shur, V.Y., Kuznetsov, D.K., Mingaliev, E.A., Fontana, M.D., Bourson, P., (2011) Phys. Solid State, 53, p. 109. , 10.1134/S1063783411010367; Caciuc, V., Postnikov, A., (2001) Phys. Rev. B, 64, p. 224303. , 10.1103/PhysRevB.64.224303; Lines, M.E., Glass, A.M., (1977) Principles and Applications of Ferroelectrics and Related Materials, p. 680. , (Clarendon Press, Oxford); Stone, G., Knorr, B., Gopalan, V., Dierolf, V., (2011) Phys. Rev. B, 84, p. 134303. , 10.1103/PhysRevB.84.134303; Scott, J.G., Mailis, S., Sones, C.L., Eason, R.W., (2004) Appl. Phys. A: Mater. Sci. Process., 79, p. 691. , 10.1007/s00339-003-2249-7; Kasprowicz, D., Lapinski, A., Runka, T., Speghini, A., Bettinelli, M., (2009) J. Alloys Compd., 478, p. 30. , 10.1016/j.jallcom.2008.11.096; Wilde, R.E., (1991) J. Raman Spectrosc., 22, p. 321. , 10.1002/jrs.1250220604; Caciuc, V., Postnikov, A., Borstel, G., (2000) Phys. Rev. B, 61, p. 8806. , 10.1103/PhysRevB.61.8806; Shur, V.Y., Kuznetsov, D.K., Mingaliev, E.A., Yakunina, E.M., Lobov, A.I., Ievlev, A.V., (2011) Appl. Phys. Lett., 99, p. 082901. , 10.1063/1.3628646; Ma, H., Levy, J., (2006) Nano Lett., 6, p. 341. , 10.1021/nl052415u; Yang, T., Gopalan, V., Swart, P., Mohideen, U., (1999) Phys. Rev. Lett., 82, p. 4106. , 10.1103/PhysRevLett.82.4106; Gruverman, A., Tokumoto, H., Prakash, A.S., Aggarwal, S., Yang, B., Wuttig, M., Ramesh, R., Venkatesan, T., (1997) Appl. Phys. Lett., 71, p. 3492. , 10.1063/1.120369; Ganpule, C.S., Nagarajan, V., Ogale, S.B., Roytburd, A.L., Williams, E.D., Ramesh, R., (2000) Appl. Phys. Lett., 77, p. 3275. , 10.1063/1.1322051; Ganpule, C., Roytburd, A., Nagarajan, V., Hill, B., Ogale, S., Williams, E., Ramesh, R., Scott, J., (2001) Phys. Rev. B, 65, p. 014101. , 10.1103/PhysRevB.65.014101; Hong, S., Colla, E.L., Kim, E., Taylor, D.V., Tagantsev, A.K., Muralt, P., No, K., Setter, N., (1999) J. Appl. Phys., 86, p. 607. , 10.1063/1.370774; Gruverman, A., Rodriguez, B.J., Dehoff, C., Waldrep, J.D., Kingon, A.I., Nemanich, R.J., Cross, J.S., (2005) Appl. Phys. Lett., 87, p. 082902. , 10.1063/1.2010605; Gruverman, A., (2012) Ferroelectrics, 433, p. 88. , 10.1080/00150193.2012.678145; Dehoff, C., Rodriguez, B.J., Kingon, A.I., Nemanich, R.J., Gruverman, A., Cross, J.S., (2005) Rev. Sci. Instrum., 76, p. 023708. , 10.1063/1.1850652; Gruverman, A., (2009) J. Mater. Sci., 44, p. 5182. , 10.1007/s10853-009-3623-4; Yang, S.M., Jo, J.Y., Kim, D.J., Sung, H., Noh, T.W., Lee, H.N., Yoon, J.-G., Song, T.K., (2008) Appl. Phys. Lett., 92, p. 252901. , 10.1063/1.2949078; Burfoot, J.C., Taylor, G.W., (1979) Polar Dielectrics and Their Applications, p. 465. , (Macmillan, London); Nath, R., Chu, Y.-H., Polomoff, N.A., Ramesh, R., Huey, B.D., (2008) Appl. Phys. Lett., 93, p. 072905. , 10.1063/1.2969045; Huey, B.D., (2007) Annu. Rev. Mater. Res., 37, p. 351. , 10.1146/annurev.matsci.37.052506.084331; Shur, V.Y., Mingaliev, E.A., Lebedev, V.A., Kuznetsov, D.K., Fursov, D.V., (2013) J. Appl. Phys., 113, p. 187211. , 10.1063/1.4801969; Valdivia, C.E., Sones, C.L., Scott, J.G., Mailis, S., Eason, R.W., Scrymgeour, D.A., Gopalan, V., Clark, I., (2005) Appl. Phys. Lett., 86, p. 022906. , 10.1063/1.1849414; Muir, A.C., Sones, C.L., Mailis, S., Eason, R.W., Jungk, T., Hoffman, A., Soergel, E., (2008) Opt. Express, 16, p. 2336. , 10.1364/OE.16.002336; Mailis, S., (2010) J. Opt., 12, p. 095601. , 10.1088/2040-8978/12/9/095601; Kuznetsov, D.K., Shur, V.Y., Negashev, S.A., Lobov, A.I., Pelegov, D.V., Shishkin, E.I., Zelenovskiy, P.S., Osipov, V.V., (2008) Ferroelectrics, 373, p. 133. , 10.1080/00150190802409059; Kuznetsov, D.K., Shur, V.Y., Mingaliev, E.A., Negashev, S.A., Lobov, A.I., Rumyantsev, E.L., Novikov, P.A., (2010) Ferroelectrics, 398, p. 49. , 10.1080/00150193.2010.489813; Mingaliev, E.A., Shur, V.Y., Kuznetsov, D.K., Negashev, S.A., Lobov, A.I., (2010) Ferroelectrics, 399, p. 7. , 10.1080/00150193.2010.489847; Shur, V.Y., Mingaliev, E.A., Kuznetsov, D.K., Kosobokov, M.S., (2013) Ferroelectrics, 443, p. 95. , 10.1080/00150193.2013.784180; Ievlev, A.V., Jesse, S., Morozovska, A.N., Strelcov, E., Eliseev, E.A., Pershin, Y.V., Kumar, A., Kalinin, S.V., (2013) Nat. Phys., 10, p. 59. , 10.1038/nphys2796; Shur, V.Y., Alikin, D.O., Ievlev, A.V., Dolbilov, M.A., Sarmanova, M.F., Gavrilov, N.V., (2012) IEEE Trans. Ultrason. Ferroelectr. Freq. Control, 59, p. 1934. , 10.1109/TUFFC.2012.2410; Pryakhina, V.I., Shur, V.Y., Alikin, D.O., Negashev, S.A., (2012) Ferroelectrics, 439, p. 20. , 10.1080/00150193.2012.743374; Shur, V., Rumyantsev, E., Makarov, S., (1998) J. Appl. Phys., 84, p. 445. , 10.1063/1.368047; Korkishko, Y.N., Fedorov, V.A., (1999) Ion Exchange in Single Crystals for Integrated Optics and Optoelectronics, p. 516. , (Cambridge International Science Publishing, Cambridge); Jackel, J.L., Rice, C.E., Veselka, J.J., (1982) Appl. Phys. Lett., 41, p. 607. , 10.1063/1.93615; Micheli, M.P.D., (2006) Ferroelectrics, 340, p. 49. , 10.1080/00150190600888827; Dolbilov, M.A., Shur, V.Y., Shishkin, E.I., Sarmanova, M.F., Nikolaeva, E.V., Tascu, S., Baldi, P., Micheli, M.P.D., (2008) Ferroelectrics, 374, p. 14. , 10.1080/00150190802418902; Shur, V.Y., Nikolaeva, E.V., Shishkin, E.I., Kozhevnikov, V.L., Chernykh, A.P., Terabe, K., Kitamura, K., (2001) Appl. Phys. Lett., 79, p. 3146. , 10.1063/1.1416471; Shur, V.Y., Chezganov, D.S., Nebogatikov, M.S., Baturin, I.S., Neradovskiy, M.M., (2012) J. Appl. Phys., 112, p. 104113. , 10.1063/1.4766308
Correspondence Address Shur, V.Ya.; Ferroelectric Laboratory, Institute of Natural Sciences, Ural Federal University, 620000 Ekaterinburg, Russian Federation; email: vladimir.shur@urfu.ru
Publisher American Institute of Physics Inc.
CODEN JAPIA
Language of Original Document English
Abbreviated Source Title J Appl Phys
Source Scopus