Humidity effects on tip-induced polarization switching in lithium niobate / Ievlev A.V., Morozovska A.N., Shur V.Ya., Kalinin S.V. // Applied Physics Letters. - 2014. - V. 104, l. 9.

ISSN:

00036951

Type:

Article

Abstract:

In the last several decades, ferroelectrics have attracted much attention as perspective materials for nonlinear optics and data storage devices. Scanning probe microscopy (SPM) has emerged as a powerful tool both for studies of domain structures with nanoscale spatial resolution and for writing the isolated nanodomains by local application of the electric field. Quantitative analysis of the observed behavior requires understanding the role of environmental factors on imaging and switching process. Here, we study the influence of the relative humidity in the SPM chamber on tip-induced polarization switching. The observed effects are attributed to existence of a water meniscus between the tip and the sample surface in humid atmosphere. These results are important for a deeper understanding of complex investigations of ferroelectric materials and their applications and suggest the necessity for fundamental studies of electrocapillary phenomena at the tip-surface junction and their interplay with bias-induced materials responses. © 2014 AIP Publishing LLC.

Author keywords:

Index keywords:

Data storage devices; Domain structure; Environmental factors; Fundamental studies; Humid atmospheres; Nanoscale spatial resolution; Polarization switching; Switching process; Electric fields; Ferroel

DOI:

10.1063/1.4867979

Смотреть в Scopus:

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84896751979&doi=10.1063%2f1.4867979&partnerID=40&md5=a00f27ca623ee4da2d604fd680b7741f

Соавторы в МНС:

Другие поля

Поле	Значение
Art. No.	092908
Link	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84896751979&doi=10.1063%2f1.4867979&partnerID=40&md5=a00f27ca623ee4da2d604fd680b7741f
Affiliations	Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37922, United States; Ferroelectric Laboratory, Institute of Natural Sciences, Ural Federal University, 51 Lenin Ave., 620000 Ekaterinburg, Russian Federation; Institute of Physics, National Academy of Sciences of Ukraine, 46 pr. Nauki, 03028 Kiev, Ukraine
References	Kolosov, O., Gruverman, A., Hatano, J., Takahashi, K., Tokumoto, H., (1995) Phys. Rev. Lett., 74, p. 4309. , 10.1103/PhysRevLett.74.4309; Gruverman, A., Auciello, O., Tokumoto, H., (1998) Annu. Rev. Mater. Sci., 28, p. 101. , 10.1146/annurev.matsci.28.1.101; Gruverman, A., Auciello, O., Ramesh, R., Tokumoto, H., (1997) Nanotechnology, 8, pp. A38. , 10.1088/0957-4484/8/3A/008; Gruverman, A.L., Hatano, J., Tokumoto, H., (1997) Jpn. J. Appl. Phys., Part 1, 36, p. 2207. , 10.1143/JJAP.36.2207; Balke, N., Bdikin, I., Kalinin, S.V., Kholkin, A.L., (2009) J. Am. Ceram. Soc., 92, p. 1629. , 10.1111/j.1551-2916.2009.03240.x; Kalinin, S.V., Morozovska, A.N., Chen, L.Q., Rodriguez, B.J., (2010) Rep. Prog. Phys., 73, p. 056502. , 10.1088/0034-4885/73/5/056502; Bonnell, D.A., Kalinin, S.V., Kholkin, A.L., Gruverman, A., (2009) MRS Bull., 34, p. 648. , 10.1557/mrs2009.176; Gruverman, A., Kholkin, A., (2006) Rep. Prog. Phys., 69, p. 2443. , 10.1088/0034-4885/69/8/R04; Gruverman, A., Alexe, M., (2004) Characterization of Ferroelectric Materials, , (Springer, Berlin, New York); Soergel, E., (2011) J. Phys. D: Appl. Phys., 44, p. 464003. , 10.1088/0022-3727/44/46/464003; Paruch, P., Tybell, T., Triscone, J.-M., (2001) Appl. Phys. Lett., 79, p. 530. , 10.1063/1.1388024; Cho, Y., Fujimoto, K., Hiranaga, Y., Wagatsuma, Y., Onoe, A., Terabe, K., Kitamura, K., (2002) Appl. Phys. Lett., 81, p. 4401. , 10.1063/1.1526916; Fujimoto, K., Cho, Y., (2003) Appl. Phys. Lett., 83, p. 5265. , 10.1063/1.1635961; Terabe, K., Nakamura, M., Takekawa, S., Kitamura, K., Higuchi, S., Gotoh, Y., Cho, Y., (2003) Appl. Phys. Lett., 82, p. 433. , 10.1063/1.1538351; Rodriguez, B.J., Nemanich, R.J., Kingon, A., Gruverman, A., Kalinin, S.V., Terabe, K., Liu, X.Y., Kitamura, K., (2005) Appl. Phys. Lett., 86, p. 012906. , 10.1063/1.1845594; Agronin, A., Molotskii, M., Rosenwaks, Y., Rosenman, G., Rodriguez, B.J., Kingon, A.I., Gruverman, A., (2006) J. Appl. Phys., 99, p. 104102. , 10.1063/1.2197264; Hong, S., Colla, E.L., Kim, E., Taylor, D.V., Tagantsev, A.K., Muralt, P., No, K., Setter, N., (1999) J. Appl. Phys., 86, p. 607. , 10.1063/1.370774; Jesse, S., Baddorf, A.P., Kalinin, S.V., (2006) Appl. Phys. Lett., 88, p. 062908. , 10.1063/1.2172216; Morozovska, A.N., Svechnikov, S.V., Eliseev, E.A., Jesse, S., Rodriguez, B.J., Kalinin, S.V., (2007) J. Appl. Phys., 102, p. 114108. , 10.1063/1.2818370; Kalinin, S.V., Bonnell, D.A., (2004) Nano Lett., 4, p. 555. , 10.1021/nl0350837; Ievlev, A.V., Jesse, S., Morozovska, A.N., Strelcov, E., Eliseev, E.A., Pershin, Y.V., Kumar, A., Kalinin, S.V., (2013) Nat. Phys., 10, p. 59. , 10.1038/nphys2796; Kalinin, S., Bonnell, D., (2001) Phys. Rev. B, 63, p. 125411. , 10.1103/PhysRevB.63.125411; Kalinin, S.V., Johnson, C.Y., Bonnell, D.A., (2002) J. Appl. Phys., 91, p. 3816. , 10.1063/1.1446230; Shur, V.Y., Ievlev, A.V., Nikolaeva, E.V., Shishkin, E.I., Neradovskiy, M.M., (2011) J. Appl. Phys., 110, p. 052017. , 10.1063/1.3624798; Dahan, D., Molotskii, M., Rosenman, G., Rosenwaks, Y., (2006) Appl. Phys. Lett., 89, p. 152902. , 10.1063/1.2358855; Sun, X., Su, Y.J., Gao, K.W., Guo, L.Q., Qiao, L.J., Chu, W.Y., (2011) J. Appl. Phys., 110, p. 014103. , 10.1063/1.3603020; Brugère, A., Gidon, S., Gautier, B., (2011) J. Appl. Phys., 110, p. 052016. , 10.1063/1.3623762; Schenk, M., Fuüting, M., Reichelt, R., (1998) J. Appl. Phys., 84, p. 4880. , 10.1063/1.368731; Weeks, B.L., Vaughn, M.W., Deyoreo, J.J., (2005) Langmuir, 21, p. 8096. , 10.1021/la0512087; Jesse, S., Kalinin, S.V., (2011) J. Phys. D: Appl. Phys., 44, p. 464006. , 10.1088/0022-3727/44/46/464006; Jesse, S., Lee, H.N., Kalinin, S.V., (2006) Rev. Sci. Instrum., 77, p. 073702. , 10.1063/1.2214699; Stifter, T., Marti, O., Bhushan, B., (2000) Phys. Rev. B, 62, p. 13667. , 10.1103/PhysRevB.62.13667; Butt, H.-J., Untch, M.B., Golriz, A., Pihan, S.A., Berger, R., (2011) Phys. Rev. e, 83, p. 061604. , 10.1103/PhysRevE.83.061604
Correspondence Address	Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37922, United States
CODEN	APPLA
Language of Original Document	English
Abbreviated Source Title	Appl Phys Lett
Source	Scopus