References |
Seidel, J., Martin, L.W., He, Q., Zhan, Q., Chu, Y.-H., Rother, A., Hawkridge, M.E., Ramesh, R., (2009) Nature Mater., 8, p. 229. , 1476-1122 10.1038/nmat2373; Ya. Shur, V., (2005) Nucleation Theory and Applications, pp. 178-214. , in edited by J. W. P. Schmelzer (Wiley -VCH, Weinheim; Ya. Shur, V., (2006) Ferroelectrics, 340, p. 3. , 0015-0193 10.1080/00150190600888603; Ya. Shur, V., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., (2000) Appl. Phys. Lett., 77, p. 3636. , APPLAB 0003-6951 10.1063/1.1329327; Zelenovskiy, P.S., Ya. Shur, V., Bourson, P., Fontana, M.D., Kuznetsov, D.K., Mingaliev, E.A., (2010) Ferroelectrics, 398, p. 34. , FEROA8 0015-0193 10.1080/00150193.2010.489810; Yang, T.J., Gopalan, V., Swart, P.J., Mohideen, U., (1999) Phys. Rev. Lett., 82, p. 4106. , PRLTAO 0031-9007 10.1103/PhysRevLett.82.4106; Fujimoto, K., Cho, Y., (2003) Appl. Phys. Lett., 83, p. 5265. , APPLAB 0003-6951 10.1063/1.1635961; Xue, D., Wu, S., Zhu, Y., Terabe, K., Kitamura, K., Wang, J., (2003) Chem. Phys. Lett., 377, p. 475. , CHPLBC 0009-2614 10.1016/S0009-2614(03)01190-4; Cho, Y., Hashimoto, S., Odagawa, N., Tanaka, K., Hiranaga, Y., (2006) Nanotechnology, 17, p. 137. , NNOTER 0957-4484 10.1088/0957-4484/17/7/S06; Cho, Y., Hashimoto, S., Odagawa, N., Tanaka, K., Hiranaga, Y., Realization of 10 Tbit in.2 memory density and subnanosecond domain switching time in ferroelectric data storage (2005) Applied Physics Letters, 87 (23), pp. 1-3. , DOI 10.1063/1.2140894, 232907; Molotskii, M., Agronin, A., Urenski, P., Shvebelman, M., Rosenman, G., Rosenwaks, Y., (2003) Phys. Rev. Lett., 90, p. 107601. , PRLTAO 0031-9007 10.1103/PhysRevLett.90.107601; Grekov, A.A., Adonin, A.A., Protsenko, N.P., (1975) Ferroelectrics, 12, p. 483; Agronin, A., Molotskii, M., Rosenwaks, Y., Rosenman, G., Rodriguez, B.J., Kingon, A.I., Gruverman, A., Dynamics of ferroelectric domain growth in the field of atomic force microscope (2006) Journal of Applied Physics, 99 (10), p. 104102. , DOI 10.1063/1.2197264; Gopalan, V., Mitchell, T.E., (1998) J. Appl. Phys., 83, p. 941. , JAPIAU 0021-8979 10.1063/1.366782; Guro, G.M., Ivanchik, I.I., Kovtonuk, N.F., (1968) Fiz. Tverd. Tela (Leningrad), 10, p. 134; Guro, G.M., Ivanchik, I.I., Kovtonuk, N.F., (1968) Sov. Phys. Solid State, 10, p. 100. , [; Guro, G.I., Ivanchik, I.I., Kovtoniuk, N.F., (1969) Fiz. Tverd. Tela (Leningrad), 11, p. 1956; Guro, G.I., Ivanchik, I.I., Kovtoniuk, N.F., (1970) Sov. Phys. Solid State, 11, p. 1574. , [; Fridkin, V.M., (1980) Ferroelectrics Semiconductors, , Consultant Bureau, New-York and London; Mokry, P., Tagantsev, A.K., Fousek, J., (2007) Phys. Rev. B, 75, p. 094110. , PLRBAQ 1098-0121 10.1103/PhysRevB.75.094110; Gureev, M.Y., Tagantsev, A.K., Setter, N., (2009) 18th IEEE International Symposium on the Applications of Ferroelectrics, 2009, ISAF 2009, , in IEEE, Piscataway, NJ; Gureev, M.Y., Tagantsev, A.K., Setter, N., (2011) Phys. Rev. B, 83, p. 184104. , 1098-0121 10.1103/PhysRevB.83.184104; Tagantsev, A.K., Gerra, G., Interface-induced phenomena in polarization response of ferroelectric thin films (2006) Journal of Applied Physics, 100 (5), p. 051607. , DOI 10.1063/1.2337009; Woo, C.H., Zheng, Y., (2007) Appl. Phys. A: Mater. Sci. Process., 91, p. 59; A. M. Bratkovsky and A. P. Levanyuk, e-print arXiv: 0801.1669; Rupprecht, G., Bell, R.O., (1964) Phys. Rev., 135, p. 748. , PHRVAO 0031-899X 10.1103/PhysRev.135.A748; Katsufuji, T., Takagi, H., (2001) Phys. Rev. B, 64, p. 054415. , PLRBAQ 1098-0121 10.1103/PhysRevB.64.054415; Ashcroft, N.W., Mermin, N.D., (1976) Solid State Physics, , Holt, Rinehart and Winston, New York; Sze, S.M., (1981) Physics of Semiconductor Devices, , 2nd ed. (Wiley-Interscience, New York; Anselm, A.I., (1981) Introduction to Semiconductor Theory, , Mir, Moscow/Prentice-Hall, Englewood Cliffs, NJ; Scrymgeour, D.A., Gopalan, V., Itagi, A., Saxena, A., Swart, P.J., Phenomenological theory of a single domain wall in uniaxial trigonal ferroelectrics: Lithium niobate and lithium tantalate (2005) Physical Review B - Condensed Matter and Materials Physics, 71 (18), p. 184110. , http://oai.aps.org/oai/?verb=ListRecords&metadataPrefix= oai_apsmeta_2&set=journal:PRB:71, DOI 10.1103/PhysRevB.71.184110; Didomenico, Jr.M., Wemple, S.H., (1967) Phys. Rev., 155, p. 539. , PHRVAO 0031-899X 10.1103/PhysRev.155.539; Moos, R., McNesklou, W., Hardtl, K.H., (1995) Appl. Phys. A: Mater. Sci. Process., 61, p. 389. , 0947-8396 10.1007/BF01540113; Moos, R., Heinz Härdtl, K., (1996) J. Appl. Phys., 80, p. 393. , JAPIAU 0021-8979 10.1063/1.362796; Gamal, G.A., Abdalrahman, M.M., Ashraf, M.I., Eman, H.J., (2005) J. Phys. Chem. Solids, 66, p. 1. , JPCSAW 0022-3697 10.1016/j.jpcs.2004.06.010; Xu, H., Lee, D., He, J., Sinnott, S.B., Gopalan, V., Dierolf, V., Phillpot, S.R., (2008) Phys. Rev. B, 78, p. 174103. , PLRBAQ 1098-0121 10.1103/PhysRevB.78.174103; Xu, H., Lee, D., Sinnott, S.B., Gopalan, V., Dierolf, V., Phillpot, S.R., (2009) Phys. Rev. B, 80, p. 144104. , PLRBAQ 1098-0121 10.1103/PhysRevB.80.144104; Xu, H., Chernatynskiy, A., Lee, D., Sinnott, S.B., Gopalan, V., Dierolf, V., Phillpot, S.R., (2010) Phys. Rev. B, 82, p. 184109. , PLRBAQ 1098-0121 10.1103/PhysRevB.82.184109; V. Ya. Shur, A. V. Ievlev, E. V. Nikolaeva, E. I. Shishkin, and M. M. Neradovskiy (unpublished) |