Characterization of PPLN-microstructures by means of Raman spectroscopy / Hammoum R., Fontana M.D., Bourson P., Shur V.Y. // Applied Physics A: Materials Science and Processing. - 2008. - V. 91, l. 1. - P. 65-67.

ISSN:

09478396

Type:

Article

Abstract:

In this paper we show how the Raman microprobe can be used for characterization of the domain structure in periodically poled lithium niobate (PPLN). The Raman scattered intensity of the transverse and longitudinal optical phonons was recorded across the stripe ferroelectric domains at the surface of a z-cut congruent PPLN sample. The change of integrated intensities across the domain structure was attributed to the influence of mechanical stresses and partially screened depolarization fields. © 2007 Springer-Verlag.

Author keywords:

Index keywords:

Characterization; Ferroelectric devices; Raman scattering; Raman spectroscopy; Stresses; Domain structure; Mechanical stresses; Periodically poled lithium niobate (PPLN); Raman scattered intensity; Mi

DOI:

10.1007/s00339-007-4356-3

Смотреть в Scopus:

https://www.scopus.com/inward/record.uri?eid=2-s2.0-39149122819&doi=10.1007%2fs00339-007-4356-3&partnerID=40&md5=76fedb5367a36200e588aba233616cbf

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Поле	Значение
Link	https://www.scopus.com/inward/record.uri?eid=2-s2.0-39149122819&doi=10.1007%2fs00339-007-4356-3&partnerID=40&md5=76fedb5367a36200e588aba233616cbf
Affiliations	Laboratoire Matériaux Optiques, Photonique et Systèmes, UMR CNRS 7132, University Paul Verlaine of Metz and Supélec, 2 rue E. Belin, Metz 57070, France; Ferroelectric Laboratory, Ural State University, Ekaterinburg 620083, Russian Federation
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Correspondence Address	Hammoum, R.; Laboratoire Matériaux Optiques, Photonique et Systèmes, UMR CNRS 7132, University Paul Verlaine of Metz and Supélec, 2 rue E. Belin, Metz 57070, France; email: rachid.hammoum@metz.supelec.fr
CODEN	APAMF
Language of Original Document	English
Abbreviated Source Title	Appl Phys A
Source	Scopus