| References |
Blinc, R., Laguta, V.V., Zalar, B., Banys, J., (2006) J. Materials Science, 41, p. 27; Bokov, A.A., Ye, Z.-G., (2006) J. Materials Science, 41, p. 31; Cross, L.E., (1994) Ferroelectrics, 151, p. 305; Blinc, R., Pirc, R., Zalar, B., Gregorovic, A., Bobnar, V., (2004) Ferroelectrics, 299, p. 1; Dai, X., Xu, Z., Viehland, D., (1994) Phil. Mag, B70, p. 33; Lehnen, P., Kleemann, W., Woeike, T., Pankrath, R., (2001) Phys. Rev. B, 64, p. 224109; Abplanalp, M., Baroshava, D., Bridenbaugh, P., Erhart, J., Fousek, J., Guenter, P., Nosek, J., Shulc, M., (2002) J. Appl. Phys, 91, p. 3797; Terabe, K., Takekawa, S., Nakamura, M., Kitamura, K., Higuchi, S., Gotoh, Y., Gruverman, A., (2002) Appl. Phys. Letters, 81, p. 2044; Bdikin, I.K., Shvartsman, V.V., Kholkin, A.L., (2003) Appl. Phys. Letters, 83, p. 4232; Shvartsman, V.V., Kholkin, A.L., (2004) Phys. Rev. B, 69, p. 014102; Bai, F., Li, J.F., Viehland, D., (2004) Appl. Phys. Letters, 85, p. 2313; Yin, Q.R., Li, G.R., Zeng, H.R., Liu, X.X., Heiderhoff, R., Balk, L.J., (2004) Appl. Phys. A, 78, p. 699; Shvartsman, V.V., Kholkin, A.L., Orlova, A., Kiselev, D., Bogomolov, A.A., Sternberg, A., (2005) Appl. Phys. Letters, 86, p. 202907; Shur, V.Y., Rumyantsev, E.L., Makarov, S.D., (1998) J. Appl. Phys, 84, p. 445; El Marssi, M., Farhi, R., Dellis, J.L., Glinchuk, M.D., Seguin, L., Viehland, D., (1998) J. Appl. Phys, 83, p. 5371; Shur, V.Y., Rumyantsev, E.L., Lomakin, G.G., Yakutova, O.V., Pelegov, D.V., Sternberg, A., Kosec, M., (2005) Ferroelectrics, 314, p. 245; Merz, W.J., (1956) J. Appl. Phys, 27, p. 938; Kolmogorov, A.N., (1937) Izv. Acad. Nauk USSR. Ser. Math, 3, p. 355; Avrami, M., (1939) J. Chem. Phys, 7, p. 1103; 8, 212 (1940);; 9, 177 1941; Ishibashi, Y., Takagi, Y., (1971) J. Phys. Soc. Jpn, 31, p. 506; Shur, V.Y., Rumyantsev, E.L., Makarov, S.A., Kozhevnikov, V.L., Nikolaeva, E.V., Shishkin, E.I., (1999) Integrated Ferroelectrics, 27, p. 179; Feder, J., (1988) Fractals, , Plenum Press, NY |