Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization / Shur V.Ya., Negashev S.A., Subbotin A.L., Pelegov D.V., Borisova E.A., Blankova E.B., Trolier-McKinstry S. // Physics of the Solid State. - 1999. - V. 41, l. 2. - P. 274-277.

ISSN:
10637834
Type:
Article
Abstract:
The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities Ds. The experimental dependences Ds(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film). © 1999 American Institute of Physics.
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Affiliations Inst. of Phys. and Appl. Mathematics, Ural State University, 620083 Ekaterinburg, Russian Federation; Intercollege Mat. Res. Laboratory, Pennsylvania State University, University Park, PA 16802, United States
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Correspondence Address Shur, V.Ya.; Inst. of Phys. and Appl. Mathematics, Ural State University, 620083 Ekaterinburg, Russian Federation; email: Vladimir.Shur@usu.ru
Language of Original Document English
Abbreviated Source Title Phys. Solid State
Source Scopus