Domain patterning in lithium niobate using spontaneous backswitching / Batchko R.G., Miller G.D., Shur V.Ya., Rumyantsev E.L., Fejer M.M., Byer R.L. // Proceedings of SPIE - The International Society for Optical Engineering. - 1999. - V. 3610, l. . - P. 36-43.

ISSN:

0277786X

Type:

Article

Abstract:

In nonlinear optics applications employing quasi-phasematching (QPM), short pitch domain gratings are generally required for the generation of visible and ultraviolet light. The conventional electric-field poling method enables the fabrication of periodically-poled lithium niobate (PPLN) down to generally 6 micron-pitch domains in 0.5-mm-thick substrates. While such PPLN is useful for first-order second harmonic generation (SHG) of green wavelengths, shorter periods for blue and UV SHG have been difficult to obtain in 0.5-mm-thick substrates. Here we describe an enhanced electric-field poling technique for ferroelectric materials which utilizes spontaneous flip-back towards high-resolution and high-yield domain patterning.

Author keywords:

Index keywords:

Lithium niobate; Nonlinear optics; Second harmonic generation; Ultraviolet radiation; Spontaneous backswitching; Optical materials

DOI:

нет данных

Смотреть в Scopus:

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032623772&partnerID=40&md5=4654fb4c6fcfc08928ffe5a83b09eda9

Соавторы в МНС:

Другие поля

Поле	Значение
Link	https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032623772&partnerID=40&md5=4654fb4c6fcfc08928ffe5a83b09eda9
Affiliations	Stanford Univ, Stanford, United States
Correspondence Address	Batchko, R.G.; Stanford Univ, Stanford, United States
Sponsors	SPIE
Publisher	Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States
Conference name	Proceedings of the 1999 Laser Material Crystal Growth and Nonlinear Materials and Devices
Conference date	27 January 1999 through 28 January 1999
Conference location	San Jose, CA, USA
Conference code	55257
CODEN	PSISD
Language of Original Document	English
Abbreviated Source Title	Proc SPIE Int Soc Opt Eng
Source	Scopus