OSL diagnostics of luminescent materials in a scanning electron microscope / Vokhmintsev A.S., Weinstein I.A., Karabanalov M.S., Smorodinskii Y.G. // Russian Journal of Nondestructive Testing. - 2014. - V. 50, l. 12. - P. 736-740.

ISSN:

10618309

Type:

Article

Abstract:

The principles for the application of methods of optically stimulated luminescence (OSL) in a scanning electron microscope (SEM) were developed in this work. A functional scheme for a diagnostic OSL attachment for the investigation of the local properties and distribution parameters of optically active structure complexes in wide-gap dosimeter materials was proposed. Analysis of the dependencies of OSL on the variation in the size of regions that are irradiated with electrons was conducted with anion-defective α-Al2O3 singlecrystals as an example. The possibility of OSL diagnostics of the surface of solid luminescent media and functional matrices with a microscale spatial resolution was shown. © 2014, Pleiades Publishing, Ltd.

Author keywords:

optically stimulated luminescence; SEM; spatially resolved luminescence; α-Al2O3

Index keywords:

Aluminum; Scanning electron microscopy; Distribution parameters; Functional scheme; Local property; Luminescent material; Optically Active; Optically stimulated luminescence; Spatial resolution; Spati

DOI:

10.1134/S1061830914120109

Смотреть в Scopus:

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84923790511&doi=10.1134%2fS1061830914120109&partnerID=40&md5=d1b3fed062867a307e080f95e6f114a2

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Другие поля

Поле	Значение
Link	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84923790511&doi=10.1134%2fS1061830914120109&partnerID=40&md5=d1b3fed062867a307e080f95e6f114a2
Affiliations	Ural Federal University named after the first President of Russia B.N.Yeltsin, Yekaterinburg, Russian Federation; Institute of Physics of Metals, Ural Branch of the Russian Academy of Sciences, Yekaterinburg, Russian Federation
Author Keywords	optically stimulated luminescence; SEM; spatially resolved luminescence; α-Al2O3
References	Bataev, V.A., Bataev, A.A., Alkhimov, A.P., (2007) Metody struktunogo analiza materialov i controlya kachestva detalei, , Flinta, Nauka, Moscow: (Methods for Structural Analysis of Materials and Quality Control of Parts); Goldstein, J., Yakowits, H., (1975) Practical Scanning Electron Microscopy, , Plenum Press, New York:; Ivannikov, P.V., Chekalin, N.S., Miroshnikov, P.A., Electron-beam-induced conductivity and color cathodoluminescence of natural diamond plates in scanning electron microscope (2007) J. Surf. Invest.: X-Ray, Synchrotron Neutron Tech., 1, pp. 386-393; Poelman, D., Smet, P.F., Time resolved microscopic cathodoluminescence spectroscopy for phosphor research (2014) Phys. B (Amsterdam, Neth.), 439, pp. 35-40; Yukihara, E.G., McKeever, S.W.S., (2011) Optically Stimulated Luminescence. Fundamentals and Applications, , Wiley, West Sussex:; Vokhmintsev, A.S., Weinstein, I.A., Spiridonov, D.M., Beketov, D.A., Beketov, A.R., Kinetic features of optically stimulated luminescence in aluminum nitride powder (2012) Tech. Phys. Lett., 38 (2), pp. 160-163; Vokhmintsev, A.S., Weinstein, I.A., Spiridonov, D.M., Continuous wave OSL in bulk AlN single crystals (2013) Phys. Status Solidi C, 10 (3), pp. 457-460; Chen, R., McKeever, S.W.S., (1997) Theory of Thermoluminescence and Related Phenomena, , World Scientific, Singapore:; Krasnoperov, V.S., Atnashev, Y.B., Moiseikin, E.V., Dosimetric complex for radiation control’ Korund-201-TL (2014) Defektoskopiya, pp. 3-11; Schulz, T., Albrecht, M., Irmscher, K., Spatially resolved thermoluminescence in scanning electron microscope (2011) Adv. Imaging Electron Phys., 168, pp. 337-359; Weinstein, I.A. and Vokhmintsev, A.S., RF Patent 2454657; Weinstein, I.A. and Vokhmintsev, A.S., RF Patent 2435157; Akselrod, M.S., Kortov, V.S., Kravetsky, D.J., Gotlib, V.I., Highly sensitive thermoluminescent aniondefective α-Al2O3 single crystal detectors (1990) Radiat. Prot. Dosim., 32 (1), pp. 15-20; Schulz, T., Albrecht, M., Irmscher, M., Thermoluminescence in a scanning electron microscope (2008) J. Appl. Phys. (Melville, NY, U. S.), 104, p. 083710
Correspondence Address	Vokhmintsev, A.S.; Ural Federal University named after the first President of Russia B.N.YeltsinRussian Federation
Publisher	Maik Nauka Publishing / Springer SBM
Language of Original Document	English
Abbreviated Source Title	Russ. J. Nondestr. Test.
Source	Scopus