Terbium Luminescence in Alumina Xerogel Fabricated in Porous Anodic Alumina Matrix under Various Excitation Conditions / Gaponenko N. V.,Kortov V. S.,Orekhovskaya T. I.,Nikolaenko I. A.,Pustovarov V. A.,Zvonarev S. V.,Slesarev A. I.,Prislopski S. Ya. // SEMICONDUCTORS. - 2011. - V. 45, l. 7. - P. 950-953.

ISSN/EISSN:

1063-7826 / нет данных

Type:

Article

Abstract:

Terbium-doped alumina xerogel layers are synthesized by the sol-gel method in pores of a porous anodic alumina film 1 mu m thick with a pore diameter of 150 180 nm; the film is grown on a silicon substrate. The fabricated structures exhibit terbium photoluminescence with bands typical of trivalent terbium terms. Terbium X-ray luminescence with the most intense band at 542 nm is observed for the first time for such a structure. Morphological analysis of the structure by scanning electron microscopy shows the presence of xerogel clusters in pore channels, while the main pore volume remains unfilled and pore mouths remain open. The data obtained confirm the promising applications of fabricated structures for developing matrix converters of X-rays and other ionizing radiations into visible light. The possibilities of increasing luminescence intensity in the matrix converter are discussed. DOI: 10.1134/S1063782611070086

Author keywords:

FILMS; PHOTOLUMINESCENCE

DOI:

10.1134/S1063782611070086

Web of Science ID:

ISI:000294024500018

Соавторы в МНС:

Другие поля

Поле	Значение
Month	JUL
Publisher	MAIK NAUKA/INTERPERIODICA/SPRINGER
Address	233 SPRING ST, NEW YORK, NY 10013-1578 USA
Language	English
Keywords-Plus	FILMS; PHOTOLUMINESCENCE
Research-Areas	Physics
Web-of-Science-Categories	Physics, Condensed Matter
Author-Email	nik@nano.bsuir.edu.by
Number-of-Cited-References	15
Usage-Count-Since-2013	7
Journal-ISO	Semiconductors
Doc-Delivery-Number	809BA