Resonantly excited X-ray fluorescence at be is edge in BeO / Kikas A.,Kirm M.,Kisand V.,Kooser K.,Kaambre T.,Nommiste E.,Ivanov V.,Pustovarov V.,Martinson I. // JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - 2007. - V. 156, l. . - P. LXXVIII-LXXIX.

ISSN/EISSN:
0368-2048 / 1873-2526
Type:
Meeting Abstract
Abstract:
нет данных
Author keywords:
нет данных
DOI:
нет данных
Web of Science ID:
ISI:000246726300178
Соавторы в МНС:
Другие поля
Поле Значение
Month MAY
Note 10th International Conference on Electronic Spectroscopy and Structure, Foz do Iguacu, BRAZIL, AUG 28-SEP 01, 2006
Publisher ELSEVIER SCIENCE BV
Address PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Language English
EISSN 1873-2526
Research-Areas Spectroscopy
Web-of-Science-Categories Spectroscopy
ResearcherID-Numbers Kaambre, Tanel/K-3980-2014 Kisand, Vambola/A-6822-2008
ORCID-Numbers Kaambre, Tanel/0000-0003-1453-4663 Kisand, Vambola/0000-0001-9765-055X
Number-of-Cited-References 1
Journal-ISO J. Electron Spectrosc. Relat. Phenom.
Doc-Delivery-Number 171HK