In situ synchrotron x-ray diffraction study of electrical field induced fatigue in Pt/PbZr0.45Ti0.55O3/Pt ferroelectric capacitors / Menou N,Muller C,Baturin IS,Kuznetsov DK,Shur VY,Hodeau JL,Schneller T // JOURNAL OF PHYSICS-CONDENSED MATTER. - 2005. - V. 17, l. 48. - P. 7681-7688.

ISSN/EISSN:

0953-8984 / нет данных

Type:

Article

Abstract:

Highly brilliant synchrotron x-ray radiation was used to measure in situ the microstructural response of a ferroelectric capacitor subjected to bipolar rectangular pulses. High-resolution x-ray diffraction experiments were performed on a (111)-oriented PbZr0.45Ti0.55O3 thin film with a composition in the morphotropic region and sandwiched between two platinum electrodes. From original real time measurements, the microstructural changes with electrical cycling have been evidenced and correlated with the observed polarization fatigue measured during the x-ray diffraction experiment. From concomitant variations of the diffracted intensity and the switching current maximum, several mechanisms have been discussed as a possible origin of the polarization fatigue: field induced phase transformation, oxygen vacancy self-ordering and widening of the internal bulk screening field distribution function during cyclic switching.

Author keywords:

PB(ZR,TI)O-3 THIN-FILMS; PHASE-TRANSITION; SWITCHING CURRENT; DEPENDENCE; MEMORIES; DOMAINS; ORIGIN; BIAS

DOI:

10.1088/0953-8984/17/48/018

Web of Science ID:

ISI:000234268600020

Соавторы в МНС:

Другие поля

Поле	Значение
Month	DEC 7
Publisher	IOP PUBLISHING LTD
Address	DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND
Language	English
Keywords-Plus	PB(ZR,TI)O-3 THIN-FILMS; PHASE-TRANSITION; SWITCHING CURRENT; DEPENDENCE; MEMORIES; DOMAINS; ORIGIN; BIAS
Research-Areas	Physics
Web-of-Science-Categories	Physics, Condensed Matter
Author-Email	christophe.muller@l2mp.fr
ResearcherID-Numbers	Muller, Christophe/D-4278-2011 Kuznetsov, Dmitry/K-8081-2015 d2am, beamline/I-6445-2015 Baturin, Ivan/B-1164-2008 Shur, Vladimir/J-9078-2015
ORCID-Numbers	Muller, Christophe/0000-0002-6009-2870 Baturin, Ivan/0000-0002-7033-6103
Number-of-Cited-References	26
Usage-Count-Last-180-days	2
Usage-Count-Since-2013	8
Journal-ISO	J. Phys.-Condes. Matter
Doc-Delivery-Number	997SR