Polarization fatigue in PbZr0.45Ti0.55O3-based capacitors studied from high resolution synchrotron x-ray diffraction / Menou N,Muller C,Baturin IS,Shur VY,Hodeau JL // JOURNAL OF APPLIED PHYSICS. - 2005. - V. 97, l. 6.

ISSN/EISSN:

0021-8979 / нет данных

Type:

Article

Abstract:

High resolution synchrotron x-ray diffraction experiments were performed on (111)-oriented PbZr0.45Ti0.55O3-based capacitors with a composition in the morphotropic region. Diffraction analyzes were done after bipolar pulses were applied and removed, representing several places in the cyclic switching. Microstructural changes were evidenced from relative diffracted intensities variations of several Bragg reflections and a correlation with the evolution of the ferroelectric responses has been established. First, a peculiar microstructural evolution was observed during the first 3x10(4) switching cycles and was attributed to the so-called ``wake-up{''} effect. On the other hand, the onset of the fatigue phenomenon was accompanied by significant variations on integrated diffraction intensities. Several mechanisms are proposed and discussed to explain such variations. Finally, the ferroelectric responses were analyzed after x-ray diffraction experiments and compared with those measured before exposure. A detailed analysis has shown that both domain configuration and switching process are strongly influenced by x-ray irradiation. It can be considered that x rays act as a ``revealer{''} of the domain structure created during the preceding electrical treatment. (C) 2005 American Institute of Physics.

Author keywords:

SWITCHING CURRENT DATA; THIN-FILMS; PHASE-TRANSITION; MONOCLINIC PHASE; KINETIC APPROACH; FERROELECTRICS; SCENARIOS; CERAMICS; MEMORIES; DOMAINS

DOI:

10.1063/1.1870098

Web of Science ID:

ISI:000227767700063

Соавторы в МНС:

Другие поля

Поле	Значение
Month	MAR 15
Publisher	AMER INST PHYSICS
Address	CIRCULATION \& FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
Language	English
Article-Number	064108
Keywords-Plus	SWITCHING CURRENT DATA; THIN-FILMS; PHASE-TRANSITION; MONOCLINIC PHASE; KINETIC APPROACH; FERROELECTRICS; SCENARIOS; CERAMICS; MEMORIES; DOMAINS
Research-Areas	Physics
Web-of-Science-Categories	Physics, Applied
Author-Email	christophe.muller@l2mp.fr
ResearcherID-Numbers	d2am, beamline/I-6445-2015 Baturin, Ivan/B-1164-2008 Shur, Vladimir/J-9078-2015 Muller, Christophe/D-4278-2011
ORCID-Numbers	Baturin, Ivan/0000-0002-7033-6103 Muller, Christophe/0000-0002-6009-2870
Number-of-Cited-References	28
Usage-Count-Last-180-days	3
Usage-Count-Since-2013	11
Journal-ISO	J. Appl. Phys.
Doc-Delivery-Number	908DO