Failure analysis of FeCAPs. Electrical behaviour under synchrotron X-ray irradiation / Menou N,Castagnos AM,Muller C,Johnson J,Wouters DJ,Baturin I,Shur VY // INTEGRATED FERROELECTRICS. - 2004. - V. 61, l. . - P. 89-95.

ISSN/EISSN:

1058-4587 / нет данных

Type:

Article; Proceedings Paper

Abstract:

This paper presents a preliminary study of the degradation and restoration of ferroelectric properties under X-ray irradiation of Pt/SBT/Pt ferroelectric capacitors (FeCAP) and the degradation in Pt/PZT/Pt FeCAPs. The results seem to point out that aging of irradiated capacitors originates from the pinning of domain walls due to trapping of photo-generated carriers at domain boundaries. For SBT FeCAPs, the recovery of a significant switchable polarisation after electrical cycling under X-ray irradiation indicates that the domain walls are probably weakly pinned. In PZT FeCAPs, the fatigue behaviour during X-ray exposure can be explained as a result of X-ray induced acceleration of the bulk screening process due to increasing of the concentration of bulk carriers, which leads to both static and kinetic imprint effects.

Author keywords:

ferroelectric capacitors; failure analysis; PZT and SBT; synchrotron; X-ray radiation hardness THIN-FILMS; FATIGUE; SRBI2TA2O9

DOI:

10.1080/10584580490458784

Web of Science ID:

ISI:000222470500013

Соавторы в МНС:

Другие поля

Поле	Значение
Note	10th European Meeting on Ferroelectricity, Univ Cambridge, Cambridge, ENGLAND, AUG 03-08, 2003
Organization	Taylor \& Francis; Aixacct; Radiant Technologies \& Epichem Inorgtech
Publisher	TAYLOR \& FRANCIS LTD
Address	4 PARK SQUARE, MILTON PARK, ABINGDON OX14 4RN, OXON, ENGLAND
Language	English
Keywords-Plus	THIN-FILMS; FATIGUE; SRBI2TA2O9
Research-Areas	Engineering; Physics
Web-of-Science-Categories	Engineering, Electrical \& Electronic; Physics, Applied; Physics, Condensed Matter
Author-Email	muller@univ-tln.fr
ResearcherID-Numbers	Shur, Vladimir/J-9078-2015 Muller, Christophe/D-4278-2011 Baturin, Ivan/B-1164-2008
ORCID-Numbers	Muller, Christophe/0000-0002-6009-2870 Baturin, Ivan/0000-0002-7033-6103
Number-of-Cited-References	9
Usage-Count-Since-2013	4
Journal-ISO	Integr. Ferroelectr.
Doc-Delivery-Number	835GK