Fatigue effect in bulk ferroelectrics / Shur VY,Rumyantsev E,Nikolaeva E,Shishkin E,Baturin I,Shur A,Lupascu DC,Randall C,Ozgul M // . - 2002. - V. 4699, l. . - P. 40-50.

ISSN/EISSN:

0277-786X / нет данных

Type:

Proceedings Paper

Abstract:

We have used a kinetic approach to the fatigue phenomenon in ferroelectrics(1-3) for the analysis of the evolution of switching current and strain hysteresis loops in bulk PZT ceramics and the switching current in PZN-PT single crystals during cyclic switching. It is proposed that fatigue is due to a redistribution of the local internal bias field during cycling (spatially non-uniform imprint effect). The model considered is based on the fact that during cycling the ratio of the states with opposite direction of polarization ranges over the sample area. The local value of this ratio defines the change of the internal bias field at the given point during the switching cycle considered. Thus the spatial distribution of the internal bias field depends on the domain evolution prehistory. We have investigated by computer simulation the self-consistent change of the internal bias field distribution function with cycling, which leads to fatigue. The mathematical treatment of the switching current data allows us to extract the information about the evolution of the field distribution function. The fatigue-induced change of the strain loops is explained by a strong unipolarity of the growing frozen domain area, which has been predicted by our simulations. The analysis of experimental data confirms the validity of our model.

Author keywords:

ferroelectricity; domain kinetics; internal bias field; PZT ceramics; PZN-PT single crystals SWITCHABLE POLARIZATION FATIGUE; LEAD-ZIRCONATE-TITANATE; THIN-FILM CAPACITORS; PIEZOELECTRIC PROPERTIES; PB(ZR,TI)O-3 FILMS; SUPPRESSION; ELECTRODES; KINETICS

DOI:

10.1117/12.475015

Web of Science ID:

ISI:000177732900005

Соавторы в МНС:

Другие поля

Поле	Значение
Editor	Lynch, CS
Booktitle	SMART STRUCTURES AND MATERIALS 2002: ACTIVE MATERIALS: BEHAVIOR AND MECHANICS
Series	PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
Note	Smart Structures and Materials 2002 Conference, SAN DIEGO, CA, MAR 18-21, 2002
Organization	SPIE; Amer Soc Mech Engineers; Soc Exptl Mech; Boeing Co; Rhombus Consultants Grp; CSA Engn; ISIS Canada; USAF Off Sci Res; Def Adv Res Projects Agcy; Intelligent Mat Forum; USA Res OFf; Jet Propuls Lab; Natl Sci Fdn; Ceram Soc Japan; USN Off Naval Res; Nav Res Lab
Publisher	SPIE-INT SOC OPTICAL ENGINEERING
Address	1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
Language	English
ISBN	0-8194-4447-2
Keywords-Plus	SWITCHABLE POLARIZATION FATIGUE; LEAD-ZIRCONATE-TITANATE; THIN-FILM CAPACITORS; PIEZOELECTRIC PROPERTIES; PB(ZR,TI)O-3 FILMS; SUPPRESSION; ELECTRODES; KINETICS
Research-Areas	Materials Science; Physics
Web-of-Science-Categories	Materials Science, Characterization \& Testing; Materials Science, Coatings \& Films; Materials Science, Composites; Physics, Condensed Matter
ResearcherID-Numbers	Baturin, Ivan/B-1164-2008 Shur, Vladimir/J-9078-2015
ORCID-Numbers	Baturin, Ivan/0000-0002-7033-6103 Lupascu, Doru C/0000-0002-6895-1334
Number-of-Cited-References	29
Usage-Count-Since-2013	7
Doc-Delivery-Number	BV06L