Kinetics of fatigue effect / Shur VY,Rumyantsev EL,Nikolaeva EV,Shishkin EI,Baturin IS,Ozgul M,Randall CA // INTEGRATED FERROELECTRICS. - 2001. - V. 33, l. 1-4. - P. 117-132.

ISSN/EISSN:

1058-4587 / нет данных

Type:

Article; Proceedings Paper

Abstract:

We propose and confirm by computer simulation that the kinetics of fatigue phenomenon during ac switching is due to evolution of spatial distribution of bias field. Arising and growth of frozen domains as a result of self-organized domain kinetics is studied. The simulated fatigue behavior is in accord with experimental data obtained during cyclic switching using triangular and rectangular field pulses in PZT films and PZN-PT single crystals.

Author keywords:

domain structure; fatigue; cyclic switching; thin films; single crystals LEAD-ZIRCONATE-TITANATE; SWITCHABLE POLARIZATION FATIGUE; THIN-FILM CAPACITORS; SUPPRESSION; ELECTRODES; FIELD

DOI:

10.1080/10584580108222294

Web of Science ID:

ISI:000167524500014

Соавторы в МНС:

Другие поля

Поле	Значение
Note	12th International Symposium on Integrated Ferroelectrics, AACHEN, GERMANY, MAR 12-15, 2000
Organization	German Natl Sci Fdn; Minist Educ, Sci \& Res Northrhine Westphalia; Res Ctr Julich; RWTH Aachen Univ; AIXACCT Syst GmbH, Aachen; AIXTRON AG, Aachen; Infineon Technologies, Munich; Gordon \& Breach
Publisher	GORDON BREACH SCI PUBL LTD
Address	C/O STBS LTD, PO BOX 90, READING RG1 8JL, BERKS, ENGLAND
Language	English
Keywords-Plus	LEAD-ZIRCONATE-TITANATE; SWITCHABLE POLARIZATION FATIGUE; THIN-FILM CAPACITORS; SUPPRESSION; ELECTRODES; FIELD
Research-Areas	Engineering; Physics
Web-of-Science-Categories	Engineering, Electrical \& Electronic; Physics, Applied; Physics, Condensed Matter
ResearcherID-Numbers	Shishkina, Ekaterina/I-1829-2017 Baturin, Ivan/B-1164-2008 Shur, Vladimir/J-9078-2015
ORCID-Numbers	Shishkina, Ekaterina/0000-0002-2574-7472 Baturin, Ivan/0000-0002-7033-6103
Number-of-Cited-References	23
Usage-Count-Since-2013	6
Journal-ISO	Integr. Ferroelectr.
Doc-Delivery-Number	411XG