Magnetic hysteresis of Co/Si multilayers with variable thickness parameters / Vas'kovskii V. O.,Patrin G. S.,Velikanov D. A.,Savin P. A.,Svalov A. V.,Yuvchenko A. A.,Shchegoleva N. N. // PHYSICS OF METALS AND METALLOGRAPHY. - 2007. - V. 103, l. 3. - P. 278-283.

ISSN/EISSN:

0031-918X / нет данных

Type:

Article

Abstract:

The magnetic properties of Co/Si multilayers with different thicknesses of Co (2-42 nm) and Si (0.3-10 nm) layers produced by high-frequency ion sputtering have been studied. Peculiarities of the microstructure of multilayered films and regularities of their magnetization with varying the magnetic field (0-500 Oe) and temperature (4.2-300 K) have been determined. A conception of the partial interlayer mixing with the formation of surface interfaces with a granular magnetic structure has been used for a model description of the structural and chemical states and magnetic properties of the multilayers. The relative volume of interfaces and parameters of their elements-granules-vary depending on the nominal magnitudes and relationship between the layer thicknesses. This leads to specific hysteretic effects. The interlayer interaction of domain walls is likely to play a certain role in the formation of the hysteretic properties.

Author keywords:

75; 70; Ak; 75; 70; Ej THIN-FILMS

DOI:

10.1134/S0031918X07030088

Web of Science ID:

ISI:000245539000008

Соавторы в МНС:

Другие поля

Поле	Значение
Month	MAR
Publisher	MAIK NAUKA/INTERPERIODICA/SPRINGER
Address	233 SPRING ST, NEW YORK, NY 10013-1578 USA
Language	English
Keywords-Plus	THIN-FILMS
Research-Areas	Metallurgy \& Metallurgical Engineering
Web-of-Science-Categories	Metallurgy \& Metallurgical Engineering
ResearcherID-Numbers	Shchegoleva, Nina/J-4331-2013 Svalov, Andrey/M-4519-2016
ORCID-Numbers	Shchegoleva, Nina/0000-0002-3229-9444 Svalov, Andrey/0000-0002-4549-8282
Number-of-Cited-References	10
Usage-Count-Last-180-days	1
Usage-Count-Since-2013	14
Journal-ISO	Phys. Metals Metallogr.
Doc-Delivery-Number	154WQ