Magnetism of Co Layers in a Co/Si Multilayer Film / Vas'kovskiy V. O.,Patrin G. S.,Velikanov D. A.,Svalov A. V.,Savin P. A.,Yuvchenko A. A.,Shchegoleva N. N. // PHYSICS OF THE SOLID STATE. - 2007. - V. 49, l. 2. - P. 302-307.

ISSN/EISSN:

1063-7834 / нет данных

Type:

Article

Abstract:

The magnetic properties of Co/Si multilayer films produced through rf ion sputtering were studied in the temperature range 4.2-300 K. The dependences of the spontaneous magnetization and hysteresis characteristics of the films on the thicknesses of the magnetic layers and nonmagnetic spacers are established. It is shown that these dependences are determined to a large extent by interlayer interfaces, in which the effective magnetic moment of the Co atoms and the exchange interaction decrease and magnetic-anisotropy dispersion arises. A probable cause of the interface formation is interlayer mixing (which is estimated to penetrate to a depth of 15 angstrom) and the strong effect of Si on the Co electronic structure.

Author keywords:

нет данных

DOI:

10.1134/S1063783407020199

Web of Science ID:

ISI:000207463700009

Соавторы в МНС:

Другие поля

Поле	Значение
Month	FEB
Publisher	MAIK NAUKA/INTERPERIODICA/SPRINGER
Address	233 SPRING ST, NEW YORK, NY 10013-1578 USA
Language	English
Research-Areas	Physics
Web-of-Science-Categories	Physics, Condensed Matter
Author-Email	Vladimir.Vaskovskiy@usu.ru
ResearcherID-Numbers	Shchegoleva, Nina/J-4331-2013 Svalov, Andrey/M-4519-2016
ORCID-Numbers	Shchegoleva, Nina/0000-0002-3229-9444 Svalov, Andrey/0000-0002-4549-8282
Funding-Acknowledgement	Federal Agency of Science and Education of the Russian Federation {[}2.1.1, 6945]; Russian Foundation for Basic Research {[}05-0216671-a]; RFBR-Ural {[}04-02-96062]
Funding-Text	This work was supported in part by the Federal Agency of Science and Education of the Russian Federation (RNP. 2.1.1, project no. 6945), the Russian Foundation for Basic Research (project no. 05-0216671-a), and RFBR-Ural (project no. 04-02-96062).
Number-of-Cited-References	12
Usage-Count-Last-180-days	1
Usage-Count-Since-2013	15
Journal-ISO	Phys. Solid State
Doc-Delivery-Number	V10KU