Magnetoimpedance effect in CoFeNi plated wire with ac field annealing destabilized domain structure / Kurlyandskaya GV,Barandiaran JM,Gutierrez J,Garcia D,Vazquez M,Vas'kovskiy VO // JOURNAL OF APPLIED PHYSICS. - 1999. - V. 85, l. 8, 2B. - P. 5438-5440.

ISSN/EISSN:
0021-8979 / 1089-7550
Type:
Article; Proceedings Paper
Abstract:
Giant magnetoimpedance (GMI) behavior at 0.25 MHz has been studied for a composite wire consisting of a 1 mu m thick Co6Fe20Ni74 magnetic layer electroplated onto a 0.1 mm diam CuBe nonmagnetic wire. This has been done for as-deposited samples as well as after annealing under dc and ac axial magnetic fields. In the optimum conditions, a maximum GMI of 150\% is achieved. The observed GMI hysteresis in the as-prepared state decreases for high driving current used to measure the MI itself. Such hysteresis, to be avoided in technological applications, is also very much reduced after ac field annealing. GMI characteristics are analyzed considering the domain-wall stabilization occurring after the annealing treatments. (C) 1999 American Institute of Physics. {[}S0021-8979(99)17208-6].
Author keywords:
MAGNETO-IMPEDANCE
DOI:
10.1063/1.369968
Web of Science ID:
ISI:000079853500054
Соавторы в МНС:
Другие поля
Поле Значение
Month APR 15
Note 43rd Annual Conference on Magnetism and Magnetic Materials, MIAMI, FL, NOV 09-12, 1998
Organization Amer Inst Phys; IEEE Magnet Soc; Minerals Met Mat Soc; Amer Soc Testing \& Mat; Amer Ceramic Soc; Amer Phys Soc; EMTEC Magnet GmbH; Fuji Photo Film Co Ltd; IBM; Imation; Sony corp; TDK Corp; Toda Kogyo Corp; ADE Technol Inc, digital Measurement Syst Div; Komag; MMC Technol Inc
Publisher AMER INST PHYSICS
Address 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
Language English
EISSN 1089-7550
Keywords-Plus MAGNETO-IMPEDANCE
Research-Areas Physics
Web-of-Science-Categories Physics, Applied
Author-Email jon@we.lc.ehu.es
ORCID-Numbers Gutierrez Etxebarria, Jon/0000-0003-1074-3097 Barandiaran Garcia, Jose Manuel/0000-0002-5402-9314 Kurlyandskaya, Galina/0000-0002-3712-1637
Number-of-Cited-References 11
Usage-Count-Since-2013 4
Journal-ISO J. Appl. Phys.
Doc-Delivery-Number 188NF