| Month |
APR 15 |
| Note |
43rd Annual Conference on Magnetism and Magnetic Materials, MIAMI, FL, NOV 09-12, 1998 |
| Organization |
Amer Inst Phys; IEEE Magnet Soc; Minerals Met Mat Soc; Amer Soc Testing \& Mat; Amer Ceramic Soc; Amer Phys Soc; EMTEC Magnet GmbH; Fuji Photo Film Co Ltd; IBM; Imation; Sony corp; TDK Corp; Toda Kogyo Corp; ADE Technol Inc, digital Measurement Syst Div; Komag; MMC Technol Inc |
| Publisher |
AMER INST PHYSICS |
| Address |
1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA |
| Language |
English |
| EISSN |
1089-7550 |
| Keywords-Plus |
MAGNETO-IMPEDANCE |
| Research-Areas |
Physics |
| Web-of-Science-Categories |
Physics, Applied |
| Author-Email |
jon@we.lc.ehu.es |
| ORCID-Numbers |
Gutierrez Etxebarria, Jon/0000-0003-1074-3097 Barandiaran Garcia, Jose Manuel/0000-0002-5402-9314 Kurlyandskaya, Galina/0000-0002-3712-1637 |
| Number-of-Cited-References |
11 |
| Usage-Count-Since-2013 |
4 |
| Journal-ISO |
J. Appl. Phys. |
| Doc-Delivery-Number |
188NF |