Humidity effects on tip-induced polarization switching in lithium niobate / Ievlev A. V.,Morozovska A. N.,Shur V. Ya.,Kalinin S. V. // APPLIED PHYSICS LETTERS. - 2014. - V. 104, l. 9.

ISSN/EISSN:

0003-6951 / 1077-3118

Type:

Article

Abstract:

In the last several decades, ferroelectrics have attracted much attention as perspective materials for nonlinear optics and data storage devices. Scanning probe microscopy (SPM) has emerged as a powerful tool both for studies of domain structures with nanoscale spatial resolution and for writing the isolated nanodomains by local application of the electric field. Quantitative analysis of the observed behavior requires understanding the role of environmental factors on imaging and switching process. Here, we study the influence of the relative humidity in the SPM chamber on tip-induced polarization switching. The observed effects are attributed to existence of a water meniscus between the tip and the sample surface in humid atmosphere. These results are important for a deeper understanding of complex investigations of ferroelectric materials and their applications and suggest the necessity for fundamental studies of electrocapillary phenomena at the tip-surface junction and their interplay with bias-induced materials responses. (C) 2014 AIP Publishing LLC.

Author keywords:

SCANNING FORCE MICROSCOPY; FERROELECTRIC THIN-FILMS; ELECTRON-MICROSCOPY; DOMAIN-STRUCTURE; NANOSCALE; VISUALIZATION; SPECTROSCOPY; MENISCUS; BEHAVIOR; CRYSTAL

DOI:

10.1063/1.4867979

Web of Science ID:

ISI:000332729200080

Соавторы в МНС:

Другие поля

Поле	Значение
Month	MAR 3
Publisher	AMER INST PHYSICS
Address	CIRCULATION \& FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
Language	English
Article-Number	092908
EISSN	1077-3118
Keywords-Plus	SCANNING FORCE MICROSCOPY; FERROELECTRIC THIN-FILMS; ELECTRON-MICROSCOPY; DOMAIN-STRUCTURE; NANOSCALE; VISUALIZATION; SPECTROSCOPY; MENISCUS; BEHAVIOR; CRYSTAL
Research-Areas	Physics
Web-of-Science-Categories	Physics, Applied
ResearcherID-Numbers	Kalinin, Sergei/I-9096-2012 Ievlev, Anton/H-3678-2012 Shur, Vladimir/J-9078-2015
ORCID-Numbers	Kalinin, Sergei/0000-0001-5354-6152 Ievlev, Anton/0000-0003-3645-0508
Funding-Acknowledgement	Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, US Department of Energy; Government of Sverdlovsk region {[}13-02-96041-r-Ural]; RFBR {[}13-02-01391-a]; bilateral SFFR-NSF project (US National Science Foundation) {[}NSF-DMR-1210588]; bilateral SFFR-NSF project (State Fund of Fundamental Research of Ukraine) {[}UU48/002]
Funding-Text	A part of this research (A.V.I., S.V.K.) was conducted at the Center for Nanophase Materials Sciences, which was sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, US Department of Energy. V.Y.S. and A. V. I. acknowledge CNMS user proposal, RFBR, and Government of Sverdlovsk region (Grant No. 13-02-96041-r-Ural), and RFBR (Grant No. 13-02-01391-a). A.N.M. acknowledges the support via bilateral SFFR-NSF project (US National Science Foundation under NSF-DMR-1210588 and State Fund of Fundamental Research of Ukraine, Grant No. UU48/002). Authors acknowledge Dr. Arthur P. Baddorf for careful proof-reading of the paper text.
Number-of-Cited-References	33
Usage-Count-Last-180-days	4
Usage-Count-Since-2013	71
Journal-ISO	Appl. Phys. Lett.
Doc-Delivery-Number	AC7RL