Characterization of PPLN-microstructures by means of Raman spectroscopy / Hammoum R.,Fontana M. D.,Bourson P.,Shur V. Y. // APPLIED PHYSICS A-MATERIALS SCIENCE \& PROCESSING. - 2008. - V. 91, l. 1. - P. 65-67.

ISSN/EISSN:

0947-8396 / нет данных

Type:

Article

Abstract:

In this paper we show how the Raman microprobe can be used for characterization of the domain structure in periodically poled lithium niobate (PPLN). The Raman scattered intensity of the transverse and longitudinal optical phonons was recorded across the stripe ferroelectric domains at the surface of a z-cut congruent PPLN sample. The change of integrated intensities across the domain structure was attributed to the influence of mechanical stresses and partially screened depolarization fields.

Author keywords:

TEMPERATURE-DEPENDENCE; INTERNAL FIELD; DOMAIN-WALLS; LINBO3; MICROSCOPY; CRYSTALS; LITAO3

DOI:

10.1007/s00339-007-4356-3

Web of Science ID:

ISI:000253127900012

Соавторы в МНС:

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Другие поля

Поле	Значение
Month	APR
Publisher	SPRINGER
Address	233 SPRING STREET, NEW YORK, NY 10013 USA
Language	English
Keywords-Plus	TEMPERATURE-DEPENDENCE; INTERNAL FIELD; DOMAIN-WALLS; LINBO3; MICROSCOPY; CRYSTALS; LITAO3
Research-Areas	Materials Science; Physics
Web-of-Science-Categories	Materials Science, Multidisciplinary; Physics, Applied
Author-Email	rachid.hammoum@metz.supelec.fr
ResearcherID-Numbers	Shur, Vladimir/J-9078-2015
Number-of-Cited-References	20
Usage-Count-Last-180-days	2
Usage-Count-Since-2013	11
Journal-ISO	Appl. Phys. A-Mater. Sci. Process.
Doc-Delivery-Number	262CZ