Evolution of the fractal surface of amorphous lead zirconate-titanate films during crystallization / Shur VY,Negashev SA,Subbotin AL,Pelegov DV,Borisova EA,Blankova EB,Trolier-McKinstry S // PHYSICS OF THE SOLID STATE. - 1999. - V. 41, l. 2. - P. 274-277.

ISSN/EISSN:

1063-7834 / нет данных

Type:

Article

Abstract:

The recrystallization kinetics of amorphous lead zirconate-titanate films prepared by sol-gel technology are investigated experimentally using elastic scattering of light. Sequences of elastic dependences of the scattered light intensity are recorded directly during thermal annealing. The evolution of the morphology of the film surface during annealing is described in terms of the variation of their fractal dimensionalities D-s. The experimental dependences D-s(t) are compared with the results of a computer simulation of the phase transition kinetics in a thin plate (film). (C) 1999 American Institute of Physics. {[}S1063-7834(99)02302-3].

Author keywords:

FERROELECTRIC THIN-FILMS; SCATTERING; PZT

DOI:

10.1134/1.1130767

Web of Science ID:

ISI:000079470200023

Соавторы в МНС:

Другие поля

Поле	Значение
Month	FEB
Publisher	AMER INST PHYSICS
Address	CIRCULATION FULFILLMENT DIV, 500 SUNNYSIDE BLVD, WOODBURY, NY 11797-2999 USA
Language	English
Keywords-Plus	FERROELECTRIC THIN-FILMS; SCATTERING; PZT
Research-Areas	Physics
Web-of-Science-Categories	Physics, Condensed Matter
ResearcherID-Numbers	Shur, Vladimir/J-9078-2015
ORCID-Numbers	Trolier-McKinstry, Susan/0000-0002-7267-9281
Number-of-Cited-References	18
Usage-Count-Since-2013	2
Journal-ISO	Phys. Solid State
Doc-Delivery-Number	181YC