Characterization of II-VI: 3d crystals with the help of ultrasonic technique / Gudkov V. V.,Lonchakov A. T.,Zhevstovskikh I. V.,Sokolov V. I.,Korostelin Yu. V.,Landman A. I.,Surikov V. T. // PHYSICA B-CONDENSED MATTER. - 2009. - V. 404, l. 23-24. - P. 5244-5246.

ISSN/EISSN:
0921-4526 / нет данных
Type:
Article; Proceedings Paper
Abstract:
The temperature dependence of ultrasonic attenuation is proposed to use for determining concentration of dopand in a diluted magnetic semiconductor. This non-destructive method can be used for the crystal in which attenuation is caused by relaxation in the Jahn-Teller system. Attenuation coefficient per the impurity ion beta obtained at a fixed frequency was introduced as a parameter characterizing sensitivity of the method. This parameter was determined for a number of II-VI: 3d semiconductors: ZnSe:Ni2+, ZnTe:Ni2+, ZnSe:V2+, ZnSe:Cr2+, and ZnSe:Fe2+ at 54 MHz. Anomalously large value of beta = 23 x 10(-18) dB cm(2) was found for Cr2+ in ZnSe. (C) 2009 Elsevier B.V. All rights reserved.
Author keywords:
Semiconductor; Impurity; Transition metal; Ultrasonic attenuation
DOI:
10.1016/j.physb.2009.08.284
Web of Science ID:
ISI:000276029300206
Соавторы в МНС:
Другие поля
Поле Значение
Month DEC 15
Note 25th International Conference on Defects in Semiconductors, St Petersburg, RUSSIA, JUL 20-24, 2009
Organization Russian Fdn Basic Res; Russian Acad Sci
Publisher ELSEVIER SCIENCE BV
Address PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Language English
Research-Areas Physics
Web-of-Science-Categories Physics, Condensed Matter
Author-Email gudkov@imp.uran.ru
ResearcherID-Numbers Gudkov, Vladimir/L-2597-2013 Korostelin, Yury/M-9609-2015 Sokolov, Viktor/J-9376-2013 Zhevstovskikh, Irina/K-1162-2013 Lonchakov, Alexander/K-6005-2013
ORCID-Numbers Gudkov, Vladimir/0000-0001-9925-9239 Sokolov, Viktor/0000-0002-6252-8914 Zhevstovskikh, Irina/0000-0002-3277-1403 Lonchakov, Alexander/0000-0002-2797-4863
Number-of-Cited-References 6
Usage-Count-Since-2013 3
Journal-ISO Physica B
Doc-Delivery-Number 574YE