Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy / Zatsepin D. A.,Hunt A.,Moewes A.,Kurmaev E. Z.,Gavrilov N. V.,Zhidkov I. S.,Cholakh S. O. // JOURNAL OF NON-CRYSTALLINE SOLIDS. - 2011. - V. 357, l. 18. - P. 3381-3384.

ISSN/EISSN:
0022-3093 / нет данных
Type:
Article
Abstract:
The results of soft-x-ray O Ka emission (XES) and O 1s absorption spectroscopy (XAS) measurements of Pb-implanted glassy and crystalline silica are presented. The x-ray O K alpha (2p -> 1s electron transition) emission spectra of SiO2 were recorded before and after Pb-implantation with the energy of 30 keV and ion fluence 5 x 10(16) ion/cm(2). It was found that XES O K alpha of implanted samples is sensitive to the disordering degree of the oxygen sublattice. The transformations and peculiarities of the spectra shape of implanted samples are explained by the disordering and amorphization effects in the structure of Pb-implanted SiO2. Comparing the XES O K alpha of reference a-SiO2, Pb-implanted SiO2 and binary glassy PbO-SiO2 system, it was established that the ion-beam treatment of oxide matrix does not generate an oxidized Pb as Pbartype structural units. The energy band gap of 9.2 eV well coincides with previously reported data and was evaluated qualitatively with the help of overlaying the XES O Ket and XAS O 1s to the common energy scale for Pb-implanted SiO2 and binary glassy PbO-SiO2. 2011 Elsevier B.V. All rights reserved.
Author keywords:
Glassy and crystalline silica; Ion implantation; Amorphization; Soft x-ray emission and absorption spectroscopy; Lead silicate glasses LEAD-SILICATE-GLASSES; IRRADIATION
DOI:
10.1016/j.jnoncrysol.2011.06.0
Web of Science ID:
ISI:000294593000015
Соавторы в МНС:
Другие поля
Поле Значение
Month SEP 15
Publisher ELSEVIER SCIENCE BV
Address PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Language English
Keywords-Plus LEAD-SILICATE-GLASSES; IRRADIATION
Research-Areas Materials Science
Web-of-Science-Categories Materials Science, Ceramics; Materials Science, Multidisciplinary
Author-Email nexcom@list.ru
ResearcherID-Numbers Zatsepin, Dmitry/F-5520-2012 Kurmaev, Ernst/J-4254-2013 Cholakh, Seif/M-8221-2016 Zhidkov, Ivan/L-3543-2013
ORCID-Numbers Kurmaev, Ernst/0000-0003-4625-4930 Cholakh, Seif/0000-0002-9313-6614 Zhidkov, Ivan/0000-0001-8727-4730
Funding-Acknowledgement Russian Foundation {[}11-02-00022, 09-02-00493]; Natural Sciences and Engineering Research Council of Canada (NSERC); Canada Research Chair program
Funding-Text The present study was carried out under support of the Russian Foundation for Basic Research (RFBR grants no. 11-02-00022 and no. 09-02-00493), the Natural Sciences and Engineering Research Council of Canada (NSERC), and the Canada Research Chair program.
Number-of-Cited-References 20
Usage-Count-Last-180-days 1
Usage-Count-Since-2013 25
Journal-ISO J. Non-Cryst. Solids
Doc-Delivery-Number 816IX