ELECTRICAL BREAKDOWN AND HIGH-ENERGY ELECTRON EMISSION UNDER DIELECTRIC CHARGING / Kortov V. S.,Zvonarev S. V. // RUSSIAN PHYSICS JOURNAL. - 2008. - V. 51, l. 3. - P. 277-284.

ISSN/EISSN:

1064-8887 / нет данных

Type:

Article

Abstract:

A Monte-Carlo calculation model for electron transport in crystalline dielectrics charged by irradiation is improved with allowance for impact ionization and cascading processes. The electron transport in SiO2 is simulated for high-strength electric fields. It is found that a breakdown in a dielectric can occur in the electric field strength range 11.5-12.5 MV/cm.

Author keywords:

SILICON DIOXIDE; MONTE-CARLO; IMPACT IONIZATION; FIELD; TRANSPORT; FILMS; SIO2

DOI:

10.1007/s11182-008-9049-7

Web of Science ID:

ISI:000260826500009

Соавторы в МНС:

Другие поля

Поле	Значение
Month	MAR
Publisher	SPRINGER
Address	233 SPRING ST, NEW YORK, NY 10013 USA
Language	English
Keywords-Plus	SILICON DIOXIDE; MONTE-CARLO; IMPACT IONIZATION; FIELD; TRANSPORT; FILMS; SIO2
Research-Areas	Physics
Web-of-Science-Categories	Physics, Multidisciplinary
Author-Email	v.kortov@mail.ustu.ru
Number-of-Cited-References	17
Usage-Count-Last-180-days	1
Usage-Count-Since-2013	2
Journal-ISO	Russ. Phys. J.
Doc-Delivery-Number	371JB