Influence of impurity-vacancy disorder on characteristics of gadolinium-dopedceria oxide: Molecular dynamics study / Kovalenko M. A.,Kupryazhkin A. Ya // JOURNAL OF NUCLEAR MATERIALS. - 2013. - V. 440, l. 1-3. - P. 158-168.

ISSN/EISSN:
0022-3115 / нет данных
Type:
Article
Abstract:
By high-speed MD method using CPU the CGO nanocrystals of about 40,000 particles during about 0.1 mu s, in the temperature range (2500-700) K, were simulated. The influence of different dopant distributions on the nanocrystal characteristics, for two potentials sets, was investigated. For a given potentials set Gd distribution does not affect the lattice parameter and the anion diffusion coefficients. Five types of impurity vacancies were defined, by the Gd number in the nearest neighborhood, and temperature dependences were built. The formation energies of vacancies of all types were obtained. Calculated by the MD conductivity activation energy of 0.6 eV acceptable coincides with the experimental 0.7 eV, just as the absolute conductivity values. The supposition that helium in CGO ceramics dissolve in vacancies, surrounded only by cerium ions, was discussed. Analysis of the MD, conductivity measurements and helium defectoscopy shows that up to the melting temperature the vacancies are mainly associated with impurity ions. (C) 2013 Elsevier B.V. All rights reserved.
Author keywords:
IONIC-CONDUCTIVITY; SUBMICROCRYSTALLINE STRUCTURE; INTERATOMIC POTENTIALS; SOLID ELECTROLYTES; CERIA; DIFFUSION; CERAMICS; HELIUM; UO2; SOLUBILITY
DOI:
10.1016/j.jnucmat.2013.04.059
Web of Science ID:
ISI:000323396600023
Соавторы в МНС:
Другие поля
Поле Значение
Month SEP
Publisher ELSEVIER SCIENCE BV
Address PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Language English
Keywords-Plus IONIC-CONDUCTIVITY; SUBMICROCRYSTALLINE STRUCTURE; INTERATOMIC POTENTIALS; SOLID ELECTROLYTES; CERIA; DIFFUSION; CERAMICS; HELIUM; UO2; SOLUBILITY
Research-Areas Materials Science; Nuclear Science \& Technology
Web-of-Science-Categories Materials Science, Multidisciplinary; Nuclear Science \& Technology
Author-Email akm\_max@mail.ru kupr@dpt.ustu.ru
Number-of-Cited-References 28
Usage-Count-Last-180-days 2
Usage-Count-Since-2013 32
Journal-ISO J. Nucl. Mater.
Doc-Delivery-Number 204UL