Ellipsometry of Chemically Deposited PbS-ZnS Films / Sal'nikov V. V.,Markov V. F.,Barbin N. M.,Maskaeva L. N.,Mironov M. P. // TECHNICAL PHYSICS LETTERS. - 2009. - V. 35, l. 8. - P. 756-758.

ISSN/EISSN:

1063-7850 / нет данных

Type:

Article

Abstract:

The optical and dielectric characteristics of hydrochemically deposited films of lead sulfide (PbS) and supersaturated substitutional solid Solutions of the PbS-ZnS system have been studied by the ellipsometry techniques. It is established that the formation of solid solutions leads to an increase in the refractive index and a decrease in the imaginary part of the complex dielectric constant as compared to those of pure PbS films. An increase in the content of ZnS in the solid Solution us accompanied by a significant decrease in the dielectric loss tangent.

Author keywords:

THIN-FILMS; BATH

DOI:

10.1134/S1063785009080197

Web of Science ID:

ISI:000269660100019

Соавторы в МНС:

Другие поля

Поле	Значение
Month	AUG
Publisher	MAIK NAUKA/INTERPERIODICA/SPRINGER
Address	233 SPRING ST, NEW YORK, NY 10013-1578 USA
Language	English
Keywords-Plus	THIN-FILMS; BATH
Research-Areas	Physics
Web-of-Science-Categories	Physics, Applied
Author-Email	NMBarbin@uralweb.ru mln@ural.ru
Number-of-Cited-References	10
Usage-Count-Since-2013	4
Journal-ISO	Tech. Phys. Lett.
Doc-Delivery-Number	492LV