Experimental and theoretical studies of lattice distortions caused by charged 3d impurities in II-IV semiconductors / Sokolov VI,Gruzdev NB,Shirokov EA,Starovoitova VN,Sokolov AV,Kislov AN,Nekrasov IA // PHYSICS OF THE SOLID STATE. - 2002. - V. 44, l. 8. - P. 1526-1528.

ISSN/EISSN:

1063-7834 / нет данных

Type:

Article; Proceedings Paper

Abstract:

The results of studies of photoinduced lattice vibration modes associated with charged 3d impurities (in particular, Ni) in II-IV semiconductors (ZnSe, ZnO) and solid solutions ZnSSe and ZnCdSe are presented. Experimental optical exciton-vibration spectroscopy studies revealed that the local vibration modes are coupled, which is due to strong anharmonicity of the local vibrations. Analysis of phonon replicas of the zero-phonon line in the spectra allows one to elucidate the nature of the anharmonicity. Model calculations performed for ZnSe : Ni and ZnO : Ni crystals revealed that the nearest neighbor environment of a charged Ni impurity is highly distorted. A change in the charged state of Ni leads to shifts in lines of calculated and experimentally measured x-ray emission spectra and, therefore, should be taken into account. (C) 2002 MAIK ``Nauka / Interperiodica{''}.

Author keywords:

ACCEPTOR EXCITONS; ZNSE-NI; ZNO-NI; VIBRATIONS

DOI:

10.1134/1.1501351

Web of Science ID:

ISI:000177381500023

Соавторы в МНС:

Другие поля

Поле	Значение
Note	11th Feofilov Workshop on Spectroscopy of Crystals Activated by Rare-Earch and Transition-Metal Ions, KAZAN, RUSSIA, SEP 24-28, 2001
Publisher	AMER INST PHYSICS
Address	CIRCULATION \& FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
Language	English
Keywords-Plus	ACCEPTOR EXCITONS; ZNSE-NI; ZNO-NI; VIBRATIONS
Research-Areas	Physics
Web-of-Science-Categories	Physics, Condensed Matter
ResearcherID-Numbers	Gruzdev, Nikita/J-9311-2013 Sokolov, Viktor/J-9376-2013
ORCID-Numbers	Gruzdev, Nikita/0000-0001-7563-6685 Sokolov, Viktor/0000-0002-6252-8914 Nekrasov, Igor/0000-0002-0845-1100
Number-of-Cited-References	5
Usage-Count-Since-2013	3
Journal-ISO	Phys. Solid State
Doc-Delivery-Number	582ZR