| References |
Vladimirov, A.P., (1996) Golograficheskie Metody Izmereniya i Kontrolya. Tekst Lektsii (Holographic Measurement and Test Methods, Lectures), , Ekaterinburg: Ural State Technical Univ; Yamaguchi, I., Fujita, T., (1989) Proc. SPIE-Int. Soc. Opt. Eng., 1162, p. 213; Yamaguchi, I., Takemori, T., Kobayashi, K., (1989) Proc. SPIE-Int. Soc. Opt. Eng., 1162, p. 187; Kruglikov, S.V., Loginov, A.V., (1991) Mnogoelementnye Priemniki Izobrazheniya (Multielement Image Sensors), , Novosibirsk: Nauka; Stashin, V.V., Urusov, A.V., Mologontseva, O.F., (1990) Proektirovanie Tsifrovykh Ustroistv na Odnokristal'nykh Mikrokontrollerakh (Design of Digital Devices on Single-Chip Microcontrollers), , Moscow: Energoatomizdat; (1981) MCS-51 Intel. Family of Single-Chip Microcomputers, , User's Manual, Intel Corp; Fedorkov, B.G., Telets, V.A., (1990) Mikroskhemy TsAP and ATsP: Funktsionirovanie, Parametry, Primenenie (DAC and ADC Microcircuits: Functioning, Parameters, and Application), , Moscow: Energoatomizdat |
| Correspondence Address |
Vladimirov, A.P.; Institute of Engineering Science, Ural Division, Russian Academy of Sciences, Pervomaiskaya ul. 91, Ekaterinburg, 620219, Russian Federation |