| References |
Jaffe, B., Cook, W.R., Jaffe, H., (1971) Piezoelectric Ceramics, , (Academic, New York); Trolier-Mckinstry, S., Muralt, J., (2004) Electroceramics, 12, pp. 7-17; Li, S.P., Eastman, J.A., Li, Z., Foster, C.M., Newnham, R.E., Cross, L.E., (1996) Phys. Lett. A, 212, pp. 341-346; Shaw, T.M., Trolier-Mckinstry, S., McIntyre, P.C., (2000) Annu. Rev. Mater. Sci., 30, pp. 263-298; Nuraje, N., Su, K., Haboosheh, A., Samson, J., Manning, E.P., Yang, N.L., Matsui, H., (2006) Adv. Mater., 18, pp. 807-811; Fong, D.D., Stephenson, G.B., Streiffer, S.K., Eastman, J.A., Auciello, O., Fuoss, P.H., Thompson, C., (2004) Science, 304, pp. 1650-1653; Rödel, J., Jo, W., Seifert, K.T.P., Anton, E., Granzow, T., Damianovic, D., (2009) J. Am. Ceram. Soc., 92, pp. 1153-1177; Coondoo, I., Panwar, N., Kholkin, A.L., (2013) J. Adv. Dielectr., 3; Zhang, S.J., Xia, R., Shrout, T.R., (2007) Appl. Phys. Lett., 91; Wu, J.G., Xiao, D.Q., Wang, Y.Y., Wu, W.J., Zhang, B., Li, J., Zhu, J.G., (2008) Scr. Mater., 59, pp. 750-752; Ahn, C.W., Song, H.C., Nahm, S., Priya, S., Park, S.H., Uchino, K., Lee, H.G., Lee, H.J., (2006) J. Am. Ceram. Soc., 89, pp. 921-925; Saito, Y., Takao, H., Tani, T., Nonoyama, T., Takatori, K., Homma, T., Nagaya, T., Nakamura, M., (2004) Nature, 432, pp. 84-87; Hatt, A.J., Spaldin, N.A., (2010) Phys. Rev. B, 81; Liu, H., Yang, P., Yao, K., Ong, K.P., Wu, P., Wang, J., (2012) Adv. Funct. Mater., 22, pp. 937-942; Zeches, R.J., (2009) Science, 326, pp. 977-980; Hansen, P., Henning, D., Schreinemacher, H., (1998) J. Am. Ceram. Soc., 81, pp. 1369-1373; Liu, W.F., Ren, X.B., (2009) Phys. Rev. Lett., 103; Bao, H.X., Zhou, C., Xue, D.H., Gao, J.H., Ren, X.B., (2010) J. Phys. D: Appl. Phys., 43; Gao, J., Xue, D., Wang, Y., Wang, D., Zhang, L., Wu, H., Guo, S., Ren, X., (2011) Appl. Phys. Lett., 99; Coondoo, I., Panwar, N., Amorín, H., Alguero, M., Kholkin, A., (2013) J. Appl. Phys., 113; Damjanovic, D., Biancoli, A., Batooli, L., Vahabzadeh, A., Trodahl, J., (2012) Appl. Phys. Lett., 100; Tagantsev, A.K., Cross, L.E., Fousek, J., (2010) Domains in Ferroic Crystals and Thin Films, , (Springer, New York); Shvartsman, V.V., Kholkin, A.L., (2010) J. Appl. Phys., 108; Arlt, G., Hennigs, D., De With, G., (1985) J. Appl. Phys., 58, pp. 1619-1625; Arlt, G., (1990) J. Mater. Sci., 25, pp. 2655-2666; Cao, W., Randall, C.A., (1996) J. Phys. Chem. Solids, 57, pp. 1499-1505; Wada, S., Suzuki, S., Noma, T., Suzuki, T., Osada, M., Kakihana, M., Park, S.-E., Shrout, T.R., (1999) Jpn. J. Appl. Phys., Part 1, 38, pp. 5505-5511; Le Rhun, G., Vrejoiu, I., Alexe, M., (2007) Appl. Phys. Lett., 90; Vrejoiu, I., Lerhun, G., Pintilie, L., Hesse, D., Alexe, M., Gösele, U., (2006) Adv. Mater., 18, pp. 1657-1661; Tung, V.T., Tinh, N.T., Chuong, T.V., Huong, N.T.M., Tuan, D.A., Truyen, L.V., (2013) J. Mod. Phys., 4, pp. 1627-1631; Mishra, P., Kumar, P., (2013) Adv. Condens. Matter Phys., 2013; Zhirnov, V.A., (1959) Sov. Phys. JETP, 8, p. 822; Marton, P., Rychetsky, I., Hlinka, J., (2010) Phys. Rev. B, 81; Tybell, T., Paruch, P., Giamarchi, T., Triscone, J.-M., (2002) Phys. Rev. Lett., 89; Pertsev, N., Petraru, A., Bdikin, I., Kiselev, D., Kholkin, A.L., (2008) Nanotechnology, 19; Pertsev, N., Kiselev, D., Bdikin, I., Kosec, M., Kholkin, A.L., (2011) J. Appl. Phys., 110; Kholkin, A.L., Bdikin, I.K., Shvartsman, V.V., Pertsev, N.A., (2007) Nanotechnology, 18; Abplanalp, M., Fousek, J., Gunter, P., (2001) Phys. Rev. Lett., 86, pp. 5799-5802; Morita, T., Cho, Y., (2004) Appl. Phys. Lett., 84, pp. 257-259; Bühlmann, S., Colla, E., Muralt, P., (2005) Phys. Rev. B, 72; Shishkin, E.I., Shur, V.Ya., Schlaphof, F., Eng, L.M., (2006) Appl. Phys. Lett., 88; Shur, V.Ya., Ievlev, A.V., Nikolaeva, E.V., Shishkin, E.I., Neradovskiy, M.M., (2011) J. Appl. Phys., 110; Weeks, B.L., Vaughn, M.W., Deyoreo, J.J., (2005) Langmuir, 21, pp. 8096-8098; Brugre, A., Gidon, S., Gautier, B., (2011) J. Appl. Phys., 110; Ievlev, A.V., Morozovska, A.N., Shur, V.Ya., Kalinin, S.V., (2014) Appl. Phys. Lett., 104; Dahan, D., Molotskii, M., Rosenman, G., Rosenwaks, Y., (2006) Appl. Phys. Lett., 89; Kim, S., Gopalan, V., Kitamura, K., Furukawa, Y., (2001) J. Appl. Phys., 90, pp. 2949-2963; Tian, L., Gopalan, V., Galambos, L., (2004) Appl. Phys. Lett., 85, pp. 4445-4447; Molotskii, M.I., Shvebelman, M.M., (2005) Philos. Mag., 85, pp. 1637-1655; Batchko, R.G., Shur, V.Y., Fejer, M.M., Byer, R.L., (1999) Appl. Phys. Lett., 75, pp. 1673-1975; Shur, V.Ya., Rumyantsev, E.L., Nikolaeva, E.V., Shishkin, E.I., Fursov, D.V., Batchko, R.G., Eyres, L.A., Byer, R.L., (2000) Appl. Phys. Lett., 76, pp. 143-145; Shur, V.Ya., (2006) J. Mater. Sci., 41, pp. 199-210; Shur, V.Ya., (1998) Phase Transitions, 65, pp. 49-72; Wu, A., Vilarinho, P.M., Shvartsman, V.V., Suchaneck, G., Kholkin, A.L., (2005) Nanotechnology, 16, pp. 2587-2595; Kalinin, S.V., Jesse, S., Rodriguez, B.J., Chu, Y.H., Ramesh, R., Eliseev, E.A., Morozovska, A.N., (2008) Phys. Rev. Lett., 100; Schrade, D., Mueller, R., Gross, D., Utschig, T., Shur, V.Ya., Lupascu, D.C., (2007) Mech. Mater., 39, pp. 161-174 |