Month |
AUG 21 |
Publisher |
AMER INST PHYSICS |
Address |
1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA |
Language |
English |
Article-Number |
072002 |
EISSN |
1089-7550 |
Keywords-Plus |
SCANNING FORCE MICROSCOPY; FERROELECTRIC MATERIALS; POLARIZATION REVERSAL; CERAMICS; FILMS; TEMPERATURE; BIFEO3; WALLS; PHASE; SIZE |
Research-Areas |
Physics |
Web-of-Science-Categories |
Physics, Applied |
Author-Email |
anton.turygin@labfer.usu.ru |
ResearcherID-Numbers |
Kholkin, Andrei/G-5834-2010 Shur, Vladimir/J-9078-2015 |
ORCID-Numbers |
Kholkin, Andrei/0000-0003-3432-7610 Turygin, Anton/0000-0002-4843-0662 |
Funding-Acknowledgement |
RFBR {[}3-02-01391-a, 14-02-90447 Ukr-a]; national funds through the FCT/MEC {[}FCT UID/CTM/50011/2013]; FEDER under the PT Partnership Agreement; FCT, Portugal {[}SFRH/BPD/81032/2011] |
Funding-Text |
The equipment of Ural Center for Shared Use ``Modern Nanotechnology{''} UrFU has been used. The research was made possible in part by the Ministry of Education and Science of the Russian Federation, (UID RFMEFI59414X0011), by RFBR (Grant Nos. 13-02-01391-a and 14-02-90447 Ukr-a), and by UrFU development program and under the joint supervision of doctorate thesis program of French government (MMR). This work was developed in the scope of the project CICECO-Aveiro Institute of Materials (Ref. FCT UID/CTM/50011/2013), financed by national funds through the FCT/MEC and when applicable co-financed by FEDER under the PT2020 Partnership Agreement. I.C. would like to acknowledge the financial support from FCT, Portugal, through the Grant No. SFRH/BPD/81032/2011. |
Number-of-Cited-References |
56 |
Usage-Count-Last-180-days |
4 |
Usage-Count-Since-2013 |
54 |
Journal-ISO |
J. Appl. Phys. |
Doc-Delivery-Number |
CQ2OX |