Influence of the concentration of intercalated atoms and temperature on relaxation processes upon charge transfer in Cu xHfSe2 compounds / Pleshchev V.G., Melnikova N.V., Baranov N.V. // Physics of the Solid State. - 2015. - V. 57, l. 8. - P. 1494-1499.

ISSN:
10637834
Type:
Article
Abstract:
The temperature dependences of impedance spectra of the intercalation compounds CuxHfSe2 (x = 0.1, 0.2) in the frequency range from 0.1 Hz to 5 MHz have been obtained for the first time. It has been shown that the characteristic times of relaxation processes decrease with an increase in the concentration of copper in the samples, as well as with an increase in the temperature. This is accompanied by a shift of the frequency dispersion of the complex conductivity toward the higher frequency range. The frequency and temperature dependences of the dielectric loss tangent for the studied samples are characteristic of losses due to the through electrical conductivity. © 2015, Pleiades Publishing, Ltd.
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DOI:
10.1134/S1063783415080247
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Affiliations Institute of Natural Science, Ural Federal University named after the First President of Russia B. N. Yeltsin, ul. Kuibysheva 48, Yekaterinburg, Russian Federation; Institute of Metal Physics, Ural Branch of the Russian Academy of Sciences, ul. Sofii Kovalevskoi 18, Yekaterinburg, Russian Federation
Funding Details 13-02-00364-a, RFBR, Russian Foundation for Basic Research; 2582, Russian Foundation for Basic Research
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Correspondence Address Pleshchev, V.G.; Institute of Natural Science, Ural Federal University named after the First President of Russia B. N. Yeltsin, ul. Kuibysheva 48, Russian Federation
Publisher Maik Nauka-Interperiodica Publishing
Language of Original Document English
Abbreviated Source Title Phys. Solid State
Source Scopus