| Book-Group-Author |
IEEE |
| Booktitle |
2015 JOINT IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRIC, INTERNATIONAL SYMPOSIUM ON INTEGRATED FUNCTIONALITIES AND PIEZOELECTRIC FORCE MICROSCOPY WORKSHOP (ISAF/ISIF/PFM) |
| Note |
Joint IEEE International Symposium on the Applications of Ferroelectric / International Symposium on Integrated Functionalities / Piezoelectric Force Microscopy Workshop (ISAF/ISIF/PFM), Singapore, SINGAPORE, MAY 24-27, 2015 |
| Organization |
IEEE |
| Publisher |
IEEE |
| Address |
345 E 47TH ST, NEW YORK, NY 10017 USA |
| Language |
English |
| ISBN |
978-1-4799-9974-3 |
| Keywords-Plus |
THIN POLYMER-FILMS; CRYSTALLIZATION; LITHOGRAPHY; CRYSTALS; SURFACE; PT(111); MEMORY |
| Research-Areas |
Materials Science; Physics |
| Web-of-Science-Categories |
Materials Science, Multidisciplinary; Physics, Applied |
| Author-Email |
kholkin@ua.pt |
| ResearcherID-Numbers |
Kholkin, Andrei/G-5834-2010 Zelenovskiy, Pavel/L-7480-2016 Shur, Vladimir/J-9078-2015 |
| ORCID-Numbers |
Kholkin, Andrei/0000-0003-3432-7610 Zelenovskiy, Pavel/0000-0003-3895-4785 Vasilev, Semen/0000-0002-3103-1438 Nuraeva, Alla/0000-0002-1329-2474 |
| Number-of-Cited-References |
27 |
| Usage-Count-Last-180-days |
2 |
| Usage-Count-Since-2013 |
6 |
| Doc-Delivery-Number |
BE4LN |