The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration / Shkvarin A. S.,Yarmoshenko Yu. M.,Yablonskikh M. V.,Merentsov A. I.,Shkvarina E. G.,Titov A. A.,Zhukov Yu. M.,Titov A. N. // JOURNAL OF CHEMICAL PHYSICS. - 2016. - V. 144, l. 7.

ISSN/EISSN:
0021-9606 / 1089-7690
Type:
Article
Abstract:
An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.04-0.8) using x-ray photoelectron spectroscopy, resonant photoelectron spectroscopy, and x-ray absorption spectroscopy has been performed. Shift towards low energies of the Ti 2p and Se 3d core level spectra and a corresponding decrease in the photon energy of Ti 2p absorption spectra with the increase in copper concentration have been found. These sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix. (C) 2016 AIP Publishing LLC.
Author keywords:
RESONANT PHOTOEMISSION; CU; BEAMLINE
DOI:
10.1063/1.4941767
Web of Science ID:
ISI:000375797200026
Соавторы в МНС:
Другие поля
Поле Значение
Month FEB 21
Publisher AMER INST PHYSICS
Address 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
Language English
Article-Number 074702
EISSN 1089-7690
Keywords-Plus RESONANT PHOTOEMISSION; CU; BEAMLINE
Research-Areas Chemistry; Physics
Web-of-Science-Categories Chemistry, Physical; Physics, Atomic, Molecular \& Chemical
ResearcherID-Numbers Yarmoshenko, Yuri/E-9531-2011 Shkvarin, Alexey/J-4275-2013 Titov, Alexander/K-4328-2013 Shkvarina, Elena/J-7345-2013 Merentsov, Alexander/R-6275-2016 Zhukov, Yuri/O-1288-2016
ORCID-Numbers Yarmoshenko, Yuri/0000-0001-8971-2052 Shkvarin, Alexey/0000-0002-3774-5669 Titov, Alexander/0000-0003-3636-2604 Shkvarina, Elena/0000-0002-4693-0313 Merentsov, Alexander/0000-0002-0005-2594 Zhukov, Yuri/0000-0001-7457-4347
Funding-Acknowledgement Russian-German Laboratory at BESSY bilateral Program {[}14201529]; RFBR {[}14-03-00274]; Multipurpose program of the Ural Division of RAS {[}15-9-2-30]
Funding-Text The authors are grateful to the ELETTRA synchrotron for support in the framework of CiPo and BACH beamlines. This work was performed within the framework of the Russian-German Laboratory at BESSY bilateral Program, Project No. 14201529. The authors are grateful to the Collective User Centre ``Ural-M{''} of the Institute of Metallurgy UrD RAS for the x-ray powder diffractometry and to the Resource Centre ``Physical Methods of Surface Investigation{''} of Saint Petersburg State University Research Park for some XPS measurements. The research was carried out within the state assignment of FASO of Russia (theme ``Electron{''} No. 01201463326), supported in part by the RFBR Grant No. 14-03-00274 and by the project of the Multipurpose program of the Ural Division of RAS No. 15-9-2-30.
Number-of-Cited-References 25
Usage-Count-Last-180-days 1
Usage-Count-Since-2013 22
Journal-ISO J. Chem. Phys.
Doc-Delivery-Number DL7CM