Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films / Melo M., Araújo E.B., Shvartsman V.V., Shur V.Y., Kholkin A.L. // Journal of Applied Physics. - 2016. - V. 120, l. 5.

ISSN:

00218979

Type:

Article

Abstract:

Polycrystalline lanthanum lead zirconate titanate (PLZT) thin films were deposited on Pt/TiO2/SiO2/Si substrates to study the effects of the thickness and grain size on their structural and piezoresponse properties at nanoscale. Thinner PLZT films show a slight (100)-orientation tendency that tends to random orientation for the thicker film, while microstrain and crystallite size increases almost linearly with increasing thickness. Piezoresponse force microscopy and autocorrelation function technique were used to demonstrate the existence of local self-polarization effect and to study the thickness dependence of correlation length. The obtained results ruled out the bulk mechanisms and suggest that Schottky barriers near the film-substrate are likely responsible for a build-in electric field in the films. Larger correlation length evidence that this build-in field increases the number of coexisting polarization directions in larger grains leading to an alignment of macrodomains in thinner films. © 2016 Author(s).

Author keywords:

Index keywords:

Autocorrelation; Crystallite size; Electric fields; Ferroelectric ceramics; Grain size and shape; Lanthanum; Polarization; Scanning probe microscopy; Schottky barrier diodes; Semiconducting lead compo

DOI:

10.1063/1.4960137

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https://www.scopus.com/inward/record.uri?eid=2-s2.0-84982740449&doi=10.1063%2f1.4960137&partnerID=40&md5=08374e56684a34e7bc5a1e6b043172de

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Поле	Значение
Art. No.	054101
Link	https://www.scopus.com/inward/record.uri?eid=2-s2.0-84982740449&doi=10.1063%2f1.4960137&partnerID=40&md5=08374e56684a34e7bc5a1e6b043172de
Affiliations	Departamento de Física e Química, Faculdade de Engenharia de Ilha Solteira, UNESP, Univ. Estadual Paulista, Ilha Solteira, SP, Brazil; Institute for Materials Science, University Duisburg-Essen, Essen, Germany; Institute of Natural Sciences, Ural Federal University, Ekaterinburg, Russian Federation; Department of Physics, CICECO, Aveiro Institute of Materials, University of Aveiro, Aveiro, Portugal
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Correspondence Address	Araújo, E.B.; Departamento de Física e Química, Faculdade de Engenharia de Ilha Solteira, UNESP, Univ. Estadual PaulistaBrazil; email: eudes@dfq.feis.unesp.br
Publisher	American Institute of Physics Inc.
CODEN	JAPIA
Language of Original Document	English
Abbreviated Source Title	J Appl Phys
Source	Scopus