Automatized complex for measuring the electrical properties of MIM structures / Gryaznov A.O., Dorosheva I.B., Vokhmintsev A.S., Kamalov R.V., Weinstein I.A. // 2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Proceedings. - 2016. - V. , l. .

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Type:
Conference Paper
Abstract:
We have designed an automatic complex equipped by a Cascade Microtech MPS150 micro-probing station and a PXIe-4143 source measure unit from National Instruments Corporation to investigate the electrical properties of metal/insulator/metal sandwich structures. We have also succeeded in implementing conditions for the current-voltage characteristics measurements and in simulating procedures for the multiple reading/writing of digital information by means of resistive switching inside the nanostructured layers. We have studied anodized-titanium-dioxide-based Ti/TiO2-NT/Au structures with diameter of 100 micrometers, synthesized by the mask method. For the micromemristors produced, we have estimated the resistance in the low-( 50 kOhm) states. © 2016 IEEE.
Author keywords:
anodic titania; CVC; I-V characteristic curves; MIM structure; MPS150 probing station; PXIe-4143 SMU
Index keywords:
Current voltage characteristics; Anodic titania; I-V characteristic curve; MIM structure; MPS150 probing station; PXIe-4143 SMU; Titanium dioxide
DOI:
10.1109/SIBCON.2016.7491772
Смотреть в Scopus:
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84978033427&doi=10.1109%2fSIBCON.2016.7491772&partnerID=40&md5=891f4c8d37b2223b127324a9cdbc829e
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Art. No. 7491772
Link https://www.scopus.com/inward/record.uri?eid=2-s2.0-84978033427&doi=10.1109%2fSIBCON.2016.7491772&partnerID=40&md5=891f4c8d37b2223b127324a9cdbc829e
Affiliations NANOTECH Center, Ural Federal University, Mira street, 19, Yekaterinburg, Russian Federation
Author Keywords anodic titania; CVC; I-V characteristic curves; MIM structure; MPS150 probing station; PXIe-4143 SMU
References Sawa, A., Resistive switching in transition metal oxides (2008) Materials Today, 11 (6), pp. 28-36. , June; Wong, H.-S.P., Lee, H.-Y., Yu, S., Chen, Y.-S., Wu, Y., Chen, P.-S., Lee, B., Tsai, M.-J., Metal-oxide RRAM (2012) Proceedings of the IEEE, 100 (6), pp. 1951-1970. , June; Akinaga, H., Shima, H., Resistive random access memory (ReRAM) based on metal oxides (2010) Proceedings of the IEEE, 98 (12), pp. 2237-2251. , December; Wen, S., Zeng, Z., Huang, T., Associative learning of integrate-andfire neurons with memristor-based synapses (2013) Neural Processing Letters, 38 (1), pp. 69-80. , August; Chu, M., Kim, B., Park, S., Hwang, H., Jeon, M., Lee, B.H., Lee, B.-G., Neuromorphic hardware system for visual pattern recognition with memristor array and CMOS neuron (2015) IEEE Transactions on Industrial Electronics, 62 (4), pp. 2410-2419. , April; Kim, K.-H., Gaba, S., Wheeler, D., Cruz-Albrecht, J.M., Hussain, T., Srinivasa, N., Lu, W., A functional hybrid memristor crossbararray/ CMOS system for data storage and neuromorphic applications (2012) Nano Letters, 12 (1), pp. 389-395. , January; Yang, J.J., Strukov, D.B., Stewart, D.R., Memristive devices for computing (2013) Nature Nanotechnology, 8 (1), pp. 13-24. , January; Yoo, J.E., Lee, K., Tighineanu, A., Schmuki, P., Highly ordered TiO2 nanotube-stumps with memristive response (2013) Electrochemistry Communications, 34, pp. 177-180; Vokhmintsev, A.S., Weinstein, I.A., Kamalov, R.V., Dorosheva, I.B., Memristive effect in a nanotubular layer of anodized titanium dioxide (2014) Bulletin of the Russian Academy of Sciences: Physics, 78 (9), pp. 932-935; Miller, K., Nalwa, K.S., Bergerud, A., Neihart, N.M., Chaudhary, S., Memristive behavior in thin anodic Titania (2010) IEEE Electron Device Letters, 31 (7), pp. 737-739. , July
Sponsors National Instruments R and D;National Research University "Higher School of Economics"
Publisher Institute of Electrical and Electronics Engineers Inc.
Conference name 2016 International Siberian Conference on Control and Communications, SIBCON 2016
Conference date 12 May 2016 through 14 May 2016
Conference code 122173
ISBN 9781467383837
Language of Original Document English
Abbreviated Source Title Int. Sib. Conf. Control Commun., SIBCON - Proc.
Source Scopus