Simulation of the removal of a lead film from graphene by the irradiation of a target with a beam of xenon clusters / Galashev A.E., Polukhin V.A. // Russian Journal of Physical Chemistry B. - 2016. - V. 10, l. 1. - P. 15-22.

ISSN:
19907931
Type:
Article
Abstract:
The removal of a lead film from graphene by irradiating a target with a beam of xenon clusters at an incidence angle of 60° was studied by the molecular dynamics method. The complete purification of graphene was achieved at beam energies of 10 and 15 eV. Visual observation and the calculated density profiles and mobility components of the lead atoms indicate the predominantly collective nature of the separation of Pb from graphene in the course of bombardment. When a beam of clusters with an energy of 15 eV acts on the target, the detached film of lead takes a torch shape and has strong internal stresses. The graphene sheet acquires maximum roughness at a beam energy of 10 eV as a result of a large number of the direct hits of xenon clusters on its surface. © 2016, Pleiades Publishing, Ltd.
Author keywords:
film; graphene; lead; stress; xenon cluster
Index keywords:
нет данных
DOI:
10.1134/S1990793116010164
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https://www.scopus.com/inward/record.uri?eid=2-s2.0-84962652809&doi=10.1134%2fS1990793116010164&partnerID=40&md5=d858a707905357cba5e33bd3bf89f9b4
Соавторы в МНС:
Другие поля
Поле Значение
Link https://www.scopus.com/inward/record.uri?eid=2-s2.0-84962652809&doi=10.1134%2fS1990793116010164&partnerID=40&md5=d858a707905357cba5e33bd3bf89f9b4
Affiliations Institute of High Temperature Electrochemistry, Ural Branch, Russian Academy of Sciences, Yekaterinburg, Russian Federation; Institute of Materials Science and Metallurgy, Yeltsin Ural Federal University, Yekaterinburg, Russian Federation
Author Keywords film; graphene; lead; stress; xenon cluster
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Correspondence Address Galashev, A.E.; Institute of High Temperature Electrochemistry, Ural Branch, Russian Academy of SciencesRussian Federation; email: alexander-galashev@yandex.ru
Publisher Maik Nauka Publishing / Springer SBM
Language of Original Document English
Abbreviated Source Title Russ. J. Phys. Chem. B
Source Scopus